摘要:
A system for measuring optical distortion in a contoured glass sheet includes a conveyor for conveying the glass sheet in a first direction, at least one display projecting a preselected multi-phase non-repeating contrasting pattern, and at least one camera, each one of the cameras uniquely paired with one of the displays. The system may also include a control programmed to execute logic for controlling each of the cameras to acquire the desired images, and logic for analyzing and combining the data acquired by the cameras to construct a definition of the surface of the glass sheet, and logic for performing one or more optical processing operations on the surface data to analyze the optical characteristics of the glass sheet.
摘要:
Zum optischen Inspizieren einer zumindest teilweise reflektierenden Oberfläche (52) an einem Gegenstand (50) wird ein Muster (28) mit einer Vielzahl von helleren und dunkleren Bereichen (30, 32) bereitgestellt. Die helleren und dunkleren Bereiche bilden mindestens einen ersten räumlichen Intensitätsverlauf (34, 36) mit einer ersten räumlichen Periode. Der Gegenstand mit der Oberfläche wird relativ zu dem Muster um eine definierte Schiebedistanz verschoben, wobei der erste Intensitätsverlauf auf die Oberfläche fällt. Dabei nimmt die Oberfläche entlang der Schiebedistanz eine Vielzahl von unterschiedlichen Positionen relativ zu dem ersten Intensitätsverlauf ein. Es wird eine Vielzahl von Bildern über zumindest einen Bildsensor (40) aufgenommen, der eine Lichtstärke erfasst wobei die Bilder die Oberfläche mit dem ersten Intensitätsverlauf an den unterschiedlichen Positionen zeigen. In Abhängigkeit von den Bildern werden Eigenschaften der Oberfläche bestimmt. Gemäß einem Aspekt der Erfindung wird die Lichtstärke des ersten Intensitätsverlaufs (34, 36) beim Aufnehmen von mindestens einem der Bilder mit einer definierten Charakteristik (82) variiert. (Fig. 1)
摘要:
Es wird ein Stereomikroskop beschrieben, das als Operationsmikroskop einen Beobachtungsausgang für einen Chirurgen (41) und mindestens einen weiteren Beobachtungsausgang für einen Assistenten (40) aufweist, wobei das Stereomikroskop Blenden (17a bis 20b) zum wahlweisen Abschalten von Objektinformationen aufweist.
摘要:
On décrit un procédé et dispositif pour déterminer la position d'au moins un conducteur d'un composant électronique par rapport à un plan de référence. Ledit conducteur est éclairé respectivement depuis des première et deuxième positions situées latéralement et hors du plan du composant électronique. On forme respectivement des première et deuxième images à ombre d'au moins une partie dudit conducteur sur un plan d'image, ladite deuxième position étant différente de la première. Lesdites première et deuxième images d'ombre respectivement sont localisées, et des troisième et quatrième positions respectivement sont déterminées à cette fin. La position du conducteur est déterminée à partir desdites troisième et quatrième positions.
摘要:
A system for acquiring surface data from one of the surfaces of a curved panel having a specular surface and developing a surface definition of the panel includes a conveyor for conveying the panel in a first direction, at least one display projecting a preselected multi-phase non-repeating contrasting pattern, and at least one camera, each one of the cameras uniquely paired with one of the displays. The system may also include a control programmed to execute logic for controlling each of the camera/display pairs to acquire the desired images, and logic for analyzing and combining the data acquired by the cameras to construct a definition of the surface of the panel.
摘要:
A method for analyzing a surface of a specular substrate (2), comprising: - acquiring at least one image of a test pattern (10) produced by reflection from said surface, the test pattern including a periodic array of dark and light zones; - calculating the derivative of the local phase in one direction at points of the image from the image acquired; - calculating quantities representative of local enlargements in one direction at points of the image from the derivative of the phase; - calculating local optical powers from said quantities representative of local enlargements; and - calculating an altitude profile from the local optical powers.
摘要:
The present invention relates to a fringe image phase distribution analysis technique that performs one-dimensional discrete Fourier transform using temporal intensity information or spatial intensity information to calculate the phase distribution of the fringe image. The contrast (signal-to-noise ratio) of the acquired fringe image is reduced due to extreme low or high reflectance of the object to be measured and a large error occurs in the analysis result of a phase distribution, or a large measurement error occurs when an error is included in the amount of phase-shift due to environmental vibration during measurement or depending on the performance of the phase-shift device. Therefore, it is necessary to improve the analysis accuracy of the phase distribution. A plurality of phase-shifted moire fringe images is generated from high-dimensional intensity data by a thinning-out (down-sampling) process and an image interpolation process, and the phase distribution of the moire fringe is calculated by two-dimensional or three-dimensional discrete Fourier transform. In addition, the phase distribution of thinned-out is added to calculate the phase distribution of an original fringe image. Since high-dimensional intensity information which is present in both spatio-domain and temporal-domain is used, phase distribution analysis is less likely to be affected by random noise or vibration. In addition, even when measurement conditions are poor, it is possible to perform phase distribution analysis with high accuracy.
摘要:
A device for optically inspecting a test object with an at least partially reflective surface (22) has a camera (12) with a number of pixels (48) and an illuminating device (14) comprising a plurality of spatially distributed light sources (16). A workpiece receiving portion is used to position the test object relative to the illuminating device (14) and to the camera (12) such that light from the light sources (16) is reflected to the camera (12) via the surface (22). An analyzing and controlling unit (32) generates a series of different illumination patterns (38, 38'; 40) on the surface (22), wherein different light sources (16) are switched on in the course of the series. According to one aspect of the invention, an individual light origin region (60), which represents a spatial distribution of individual light contributions (56, 58) that the light sources (16) generate on at least one pixel (48) via the surface (22), is determined using the images for the at least one pixel (48), said images being received with the camera. Properties of the test object (20) are determined using the individual light origin region (60).
摘要:
The invention comprises taking colour pictures of backlighted analysis microtubes and using the colour information in the images to identify areas of the image which are relevant for interpreting the result of other possible artefacts, as well as detecting abnormal samples and/or reactions characterised by changes in the colour properties of the reaction.
摘要:
The invention concerns a method for identifying in objects made of transparent material, for example, drink bottles, diffuse dispersion defects, wherein the objects concerned (10) are examined by means of a light source (12) and a camera (16), a contrast model (14) being arranged between the light source (12) and the object to be examined. The diffuse dispersion defects are identified on the basis of a decrease in the contrast effect of the contrast model (14) represented through the object.