摘要:
Hallsensor aufweisend, ein erstes Hallelement mit einem ersten Anschlusskontakt und mit einem zweiten Anschlusskontakt und mit einem dritten Anschlusskontakt, ein zweites Hallelement mit einem vierten Anschlusskontakt und mit einem fünften Anschlusskontakt und mit einem sechsten Anschlusskontakt, ein drittes Hallelement mit einem siebten Anschlusskontakt und mit einem achten Anschlusskontakt und mit einem neunten Anschlusskontakt und ein viertes Hallelement mit einem zehnten Anschlusskontakt und mit einem elften Anschlusskontakt und mit einem zwölften Anschlusskontakt, wobei das erste Hallelement und das zweite Hallelement und das dritte Hallelement und das vierte Hallelement in Serie geschaltet sind.
摘要:
The invention relates to a magnetic field sensor comprising a substrate having a first side (S1). The substrate comprises at the first side (S1) a silicon comprising semiconductor layer (P-SUB) which comprises a buried N-well (DNW). A bipolar transistor having an emitter region (PE+, NE+), a base region (PB+, NB+), and a first collector region (CLR1) and a second collector region, is provided in the silicon comprising semiconductor layer (P-SUB). The emitter region (PE+, NE+) is located at the first side (S1) above the buried N-well (DNW). According to the invention the bipolar transistor is arranged such that, in operation, a part of an emitter current (IEM) that traverses the base region (PB+, NB+) is distributed over the first and second collector regions (CLR1, CLR2) obtaining a first and a second collector current (ICL1, ICL2), wherein a difference between the first and second collector currents (ICL1, ICL2) is determined by a magnetic field component (B x, B z ) perpendicular to a current plane. A bipolar magneto-transistor structure is obtained which is compatible with triple-well technology and that is sensitive to magnetic fields in a direction perpendicular to the current plane. The magnetic field sensor is compatible with triple-well technology and has a high linearity and a high sensitivity. The invention further relates to an integrated circuit comprising such magnetic field sensor (Snsr) and a card provided with such integrated circuit.
摘要:
The invention relates to a vertical Hall sensor in which an electroconductive region (2) extends into a substrate (1), perpendicularly to the surface of said substrate (1), in order to form a Hall sensor element (4), and comprises a plurality of first connection areas (3) along a lateral surface on the surface of the substrate (1). The inventive Hall sensor is characterised in that at least one second similar Hall sensor element (5) is arranged in the substrate (1) parallel to the first Hall sensor element (4), and is connected to the first Hall sensor element (4) in such a way that when the Hall sensor is operated according to the spinning current technique, the same combination of control current distributions is obtained in the Hall sensor in each spinning current phase. When the inventive vertical Hall sensor is operated according to the spinning current technique, it enables the offset to be significantly reduced without requiring a weighting of the individual spinning current phases.
摘要:
The invention relates to a vertical Hall sensor in which an electroconductive region (2) extends into a substrate (1), perpendicularly to the surface of said substrate (1), in order to form a Hall sensor element (4), and comprises a plurality of first connection areas (3) along a lateral surface on the surface of the substrate (1). The inventive Hall sensor is characterised in that at least one second similar Hall sensor element (5) is arranged in the substrate (1) parallel to the first Hall sensor element (4), and is connected to the first Hall sensor element (4) in such a way that when the Hall sensor is operated according to the spinning current technique, the same combination of control current distributions is obtained in the Hall sensor in each spinning current phase. When the inventive vertical Hall sensor is operated according to the spinning current technique, it enables the offset to be significantly reduced without requiring a weighting of the individual spinning current phases.
摘要:
The method allows testing a metal detection apparatus (9) with entrance and exit apertures (2A, 2B) adjoining a transfer channel (90) along which products (P) are movable through a coil system (6) that defines a detection zone (60) and comprises a transmitter coil (61) and a first and a second receiver coil (62, 63) dimensioned such that a current applied to the transmitter coil (61) induces a first coil signal in the first receiver coil (62) and a second coil signal in the second receiver coil (63), that do not compensate one another when metal (C) is present in the transferred products (P), which causes an input signal within a signal processing path (4, 5) of the metal detection apparatus (9), and with at least one test device (7) that comprises at least one test article (79) that is movable through the detection zone (60). The method comprising the steps of moving the test article (79) through the detection zone (60) along a first transfer axis (ca) and measuring a first input signal for which a first threshold (th1) is determined such that the amplitude of the first input signal exceeds the first threshold (th1); moving an identical test article (79) through the detection zone (60) along a second or further transfer axis (ta; ...) and measuring a second or further input signal for which a second or further threshold (th2; ...) is determined such that the amplitude of the second or further input signal exceeds the second or further threshold (th2; ...) and selecting said first, second or further threshold (th1; th2; ...) in the signal processing path (4) whenever the test article (79) is moved along the related first, second or further transfer axis (ca; ta; ...).
摘要:
A differential magnetic field sensor system (10) is provided, in which offset cancelling for differential semiconductor structures in magnetic field sensors arranged close to each other is realized. The system (10) comprises a first, a second and a third magnetic field sensor (100, 200, 300), each of which is layouted substantially identically and comprises a, preferably silicon-on-insulator (SOI), surface layer portion (102) provided as a surface portion on a, preferably SOI, wafer and having a surface (104). On the surface (104) is arranged a central emitter structure (110, 210, 310) formed substantially mirror symmetrical with respect to a symmetry plane (106, 206, 306) that is substantially perpendicular to the surface (104, 204, 304), and a first and a second collector structure (116, 216, 316; 118, 218, 318), each of which is arranged spaced apart from the emitter structure (110, 210, 310) and which are arranged on opposite sides of the symmetry plane (106, 206, 306) so as to be substantially mirror images of each other. The first magnetic field sensor (100) is operated double-sided in that its first collector structure (116) and its emitter structure (110) are externally connected via a first read-out circuitry and its second collector structure (118) and its emitter structure (110) are externally connected via a second read-out circuitry. The second magnetic field sensor (200) is operated single-sided in that its first collector structure (216) and its emitter structure (210) are externally connected via a third read-out circuitry. The third magnetic field sensor (300) is operated single-sided in that its second collector structure (318) and its emitter structure (310) are externally connected via a fourth read-out circuitry.
摘要:
The disclosure relates to the field of magnetic sensors and associated methods. Certain disclosed embodiments relate to semiconductor (e.g. silicon-based) magnetic sensors, including a magnetic sensor assembly comprising a semiconductor layer (117), the semiconductor layer comprising a first collector (113) and a second collector (114), a first emitter (111) and a second emitter (112); and a governing circuit (120) configured to control and measure current flow independently between the first collector and first emitter in a first direction, and between the second collector and second emitter in a second opposing direction.