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    SYSTEM AND METHOD FOR FLUORESCENCE MICROSCOPY WITH DETECTION OF LIGHT EMISSION FROM MULTIPLE FLUOROCHROMES
    1.
    发明公开
    SYSTEM AND METHOD FOR FLUORESCENCE MICROSCOPY WITH DETECTION OF LIGHT EMISSION FROM MULTIPLE FLUOROCHROMES 审中-公开
    SYSTEM UND VERFAHREN ZUR FLUORESZENZMIKROSKOPIE MIT DETEKTION DER LICHTEMISSION AUS MEHREREN FLUOROCHROMEN

    公开(公告)号：EP3084503A4

    公开(公告)日：2017-09-13

    申请号：EP14872537

    申请日：2014-12-11

    申请人： KROMNIGON AB

    发明人： FOGELSTRAND PER

    IPC分类号： G02B21/00 ,  G01N21/64 ,  G01N33/58

    CPC分类号： G02B21/16 ,  G01N21/6458 ,  G01N33/582 ,  G01N2021/6419 ,  G01N2021/6421 ,  G01N2021/6441 ,  G01N2021/6471 ,  G02B6/0001 ,  G02B21/06 ,  G02B21/088 ,  G02B26/008

    摘要： The present invention relates to fluorescence microscopy and specifically to improvements of method for and a corresponding fluorescence microscopy system for allowing separate detection of a plurality of fluorochromes.

    摘要翻译： 本发明涉及荧光显微术，并且更具体地涉及用于检测从用至少四种预定荧光染料标记的样品发射的荧光的方法，其中所述至少四种不同荧光染料包含形成一对荧光染料的第一和第二荧光染料，所述 选择成为形成第一荧光色素的Cy3荧光色素的一对荧光色素和形成第二荧光色素的594荧光色素类似物，或选择一对荧光色素作为形成第一荧光色素的425荧光色素类似物和形成第二荧光色素的488荧光色素类似物。 根据本发明，通过为第二荧光色素选择激发波长间隔以实现对来自至少四种预定荧光色素的荧光的检测，使得第一荧光色素的激发减少，并且通过选择第一荧光色素的发射波长范围 使得来自第二荧光染料的光发射的灌注减少。

    IMAGE ANALYSIS AND MEASUREMENT OF BIOLOGICAL SAMPLES
    2.
    发明公开
    IMAGE ANALYSIS AND MEASUREMENT OF BIOLOGICAL SAMPLES 审中-公开
    生物样本的图像分析和测量

    公开(公告)号：EP2956759A2

    公开(公告)日：2015-12-23

    申请号：EP14751601.7

    申请日：2014-02-18

    申请人： Theranos, Inc.

    发明人： MOHAN, Karan ,  PANGARKAR, Chinmay ,  WASSON, James ,  FOLKESSON, Jenny ,  NOURSE, Marilyn ,  KOLHAR, Poornima

    IPC分类号： G01N21/64

    CPC分类号： G02B21/125 ,  G01N21/0303 ,  G01N21/6458 ,  G02B21/088 ,  G02B21/34

    摘要： Methods, devices, apparatus, and systems are provided for image analysis. Methods of image analysis may include observation, measurement, and analysis of images of biological and other samples; devices, apparatus, and systems provided herein are useful for observation, measurement, and analysis of images of such samples. The methods, devices, apparatus, and systems disclosed herein provide advantages over other methods, devices, apparatus, and systems.

    摘要翻译： 提供了用于图像分析的方法，设备，装置和系统。 图像分析方法可以包括观察，测量和分析生物样本和其他样本的图像; 本文提供的设备，装置和系统对于这些样本的图像的观察，测量和分析是有用的。 这里公开的方法，设备，装置和系统提供优于其他方法，设备，装置和系统的优点。

    METHOD FOR OBSERVING STEM CELLS, METHOD FOR REMOVAL OF CELL REGION IN STATE TENDING TOWARD DIFFERENTIATION, AND DEVICE FOR OBSERVING STEM CELLS
    3.
    发明公开
    METHOD FOR OBSERVING STEM CELLS, METHOD FOR REMOVAL OF CELL REGION IN STATE TENDING TOWARD DIFFERENTIATION, AND DEVICE FOR OBSERVING STEM CELLS 审中-公开
    干细胞的过程监控，方法有用于监测干细胞的分化走势和设备状态的细胞分裂拆除

    公开(公告)号：EP2778231A1

    公开(公告)日：2014-09-17

    申请号：EP12847822.9

    申请日：2012-10-23

    申请人： Hamamatsu Photonics K.K.

    发明人： SUGIYAMA Norikazu ,  KATAOKA Takuji ,  ARATA Ikuo

    IPC分类号： C12Q1/02 ,  C12M1/34 ,  C12N5/071 ,  G02B21/06

    CPC分类号： G01N21/47 ,  G01N21/49 ,  G01N21/59 ,  G01N33/4833 ,  G01N33/5005 ,  G01N2201/0446 ,  G01N2201/062 ,  G02B21/088 ,  G02B21/36

    摘要： A method for observing stem cells by an observation device 1 comprises, placing stem cells C in a petri dish 11, mounting the petri dish 11 on a waveguide 21 via water 13, emitting illumination light L1 into the waveguide 21 and emitting the illumination light L1 to the stem cells C in the petri dish 11 via the water 13, and detecting scattered light L2, the scattered light L2 being the illumination light L1 emitted to the stem cells C that is scattered by the stem cells C and has passed through the waveguide 21. Then, in the light image detected by means of the scattered light L2, a region that is markedly darker than other regions is identified as being in the state tending toward differentiation.

    摘要翻译： 一种用于通过在观察装置1包括，放置在培养皿11干细胞C，经由水13上的波导21安装培养皿11发射照明光L1到波导管21和发射照明光L1观察干细胞的方法 经由水在培养皿11中的干细胞-C 13和检测的散射光L2，散射光L2是所述照明光L1射出到干单元C都通过干单元C的散射和通过了波导管通过 21.然后，在光图像由所述散射光L2的检测手段，做了一个区域是明显地比其它区域被识别为在状态朝向分化倾向是更暗。

    Projection inspecting machine
    4.
    发明公开
    Projection inspecting machine 失效
    Projektionsinspektionsapparat

    公开(公告)号：EP0770848A1

    公开(公告)日：1997-05-02

    申请号：EP97200097.0

    申请日：1991-05-14

    申请人： KABUSHIKI KAISHA TOPCON

    发明人： Yukio, Okita

    IPC分类号： G01B9/08 ,  G02B21/18 ,  G02B21/36

    CPC分类号： G02B21/0016 ,  G01B9/08 ,  G02B21/088 ,  G02B21/18 ,  G02B21/364

    摘要： A projection inspector which projects the image of an object being measured onto a screen for a visual inspection. The inspector fully exhibits high degree of measuring function even at the time of inspecting an object having a surface color and shape that can be difficulty imaged, and projects the object's image onto the screen to inspect it, and further enables it to be more correctly observed or inspected. The projection inspector is provided with a projection lens mount that is movable two-dimensionally and mounts a projection lens that constitutes a portion of the projection optical system over a plate on which the object to be measured is placed, and the object's image is projected onto the screen via the projection optical system as it is irradiated with the light of illumination, wherein the projection inspector further comprises a microscope lens-barrel portion (41) including an ocular optical system and mounted on a main body of the projection inspecting machine, and with optical switch means (46).

    摘要翻译： 投影检查器，将被测量物体的图像投影到屏幕上进行目视检查。 即使在检查具有难以成像的表面颜色和形状的物体的时候，检查者也完全展现出高度的测量功能，并且将物体的图像投射到屏幕上以进行检查，并且进一步使其能够更准确地观察 或检查。 投影检查器设置有可以二维移动并且将构成投影光学系统的一部分的投影透镜放置在放置被测量对象的板上的投影透镜座，并且将物体的图像投影到 通过投影光学系统照射照明光的屏幕，其中投影检查器还包括安装在投影检查机的主体上的包括眼睛光学系统的显微镜镜筒部分（41），以及 具有光开关装置（46）。

    STANDING WAVE INTERFEROMETRIC MICROSCOPE
    6.
    发明公开
    STANDING WAVE INTERFEROMETRIC MICROSCOPE 审中-公开
    驻波干涉显微镜

    公开(公告)号：EP3159729A1

    公开(公告)日：2017-04-26

    申请号：EP16185525.9

    申请日：2016-08-24

    申请人： FEI Company

    发明人： Daum, Rainer ,  Vögele, Xaver

    IPC分类号： G02B21/16 ,  G02B21/14 ,  G02B21/00 ,  G02B27/58

    CPC分类号： G01N21/6458 ,  G01N21/45 ,  G02B21/0056 ,  G02B21/008 ,  G02B21/06 ,  G02B21/088 ,  G02B21/14 ,  G02B21/16 ,  G02B21/18 ,  G02B21/361 ,  G02B21/364 ,  G02B27/58

    摘要： A wide-field interferometric microscope comprising:
    - A specimen holder, for holding a specimen at an analysis location;
    - An illuminator, for illuminating the specimen with input radiation, so as to cause it to emit fluorescence light;
    - A pair of projection systems, arranged at opposite sides of said analysis location, to collect at least a portion of said fluorescence light and direct a corresponding pair of light beams into a respective pair of inputs of an optical combining element, where they optically interfere;
    - A detector arrangement, for examining output light from said combining element, wherein:
    - The illuminator is configured to produce a standing wave of input radiation at the analysis location
    - The detector arrangement comprises exactly two interferometric detection branches.

    摘要翻译： 一种宽场干涉显微镜，包括： - 样品架，用于将样品保持在分析位置; - 照射器，用于利用输入辐射照射样本，以使其发射荧光; - 布置在所述分析位置的相对侧的一对投影系统，用于收集所述荧光的至少一部分并将相应的一对光束引导到光学组合元件的相应一对输入中，其中它们光学干涉 ; - 检测器装置，用于检查来自所述组合元件的输出光，其中： - 照明器被配置为在分析位置处产生输入辐射的驻波。 - 检测器装置恰好包括两个干涉检测分支。

    STANDING WAVE INTERFEROMETRIC MICROSCOPE
    7.
    发明公开
    STANDING WAVE INTERFEROMETRIC MICROSCOPE 审中-公开
    驻波干涉显微镜

    公开(公告)号：EP3159728A1

    公开(公告)日：2017-04-26

    申请号：EP15190749.0

    申请日：2015-10-21

    申请人： FEI Company

    发明人： DAUM, Rainer ,  VÖGELE, Xaver

    IPC分类号： G02B21/14 ,  G02B21/00 ,  G02B27/58

    CPC分类号： G01N21/6458 ,  G01N21/45 ,  G02B21/0056 ,  G02B21/008 ,  G02B21/06 ,  G02B21/088 ,  G02B21/14 ,  G02B21/16 ,  G02B21/18 ,  G02B21/361 ,  G02B21/364 ,  G02B27/58

    摘要： An interferometric microscope comprising:
    - A specimen holder, for holding a specimen at an analysis location;
    - An illuminator, for illuminating the specimen with input radiation, so as to cause it to emit fluorescence light;
    - A pair of projection systems, arranged at opposite sides of said analysis location, to collect at least a portion of said fluorescence light and direct a corresponding pair of light beams into a respective pair of inputs of an optical combining element, where they optically interfere;
    - A detector arrangement, for examining output light from said combining element,
    wherein the illuminator is configured to produce a standing wave of input radiation at the analysis location.

    摘要翻译： 一种干涉显微镜，包括： - 样本架，用于将样本保持在分析位置; - 照射器，用于利用输入辐射照射样本，以使其发射荧光; - 布置在所述分析位置的相对侧的一对投影系统，用于收集所述荧光的至少一部分并将相应的一对光束引导到光学组合元件的相应一对输入中，其中它们光学干涉 ; - 检测器装置，用于检查来自所述组合元件的输出光，其中照明器被配置为在分析位置处产生输入辐射的驻波。