SCAN WRAPPER CIRCUIT AND WRAPPER CELLS
    1.
    发明公开

    公开(公告)号:EP4435446A1

    公开(公告)日:2024-09-25

    申请号:EP24164532.4

    申请日:2024-03-19

    申请人: NXP B.V.

    IPC分类号: G01R31/3185 G06F30/333

    摘要: An apparatus (110) and method (200) are provided for scan testing a system-on-chip (SoC) integrated circuit having first and second partitions coupled together across one or more inter-partition circuits, each of which includes a decompressor; a compactor; an INTEST scan chain and an EXTEST scan chain coupled in parallel between the decompressor circuit and compactor circuit; and digital test control access hardware connected between the decompressor circuit and each INTEST scan chain and configured to selectively disable each INTEST scan chain while each EXTEST scan chain continues to operate in response to a partition EXTEST mode signal having a first predetermined value.