Ultrasonic microscope
    2.
    发明公开
    Ultrasonic microscope 失效
    超声波显微镜

    公开(公告)号:EP0084174A3

    公开(公告)日:1983-08-10

    申请号:EP82112077

    申请日:1982-12-28

    申请人: Hitachi, Ltd.

    IPC分类号: G01H03/12 G10K11/34

    CPC分类号: G01H3/125 B06B1/0625

    摘要: An ultrasonic microscope displays an ultrasonic wave image of a sample (60) relatively and two-dimensionally scanned with respect to an ultrasonic wave beam transmitted from and focused by a transducer including a piezoelectric element (220) and an acoustic lens (200). The F number of the acoustic lens is variably changeable while the scan in one direction of the two-dimensional scan is substituted by a time axis scan of the received echo.

    Apparatus for observing sound field of ultrasonic wave
    5.
    发明公开
    Apparatus for observing sound field of ultrasonic wave 失效
    用于观察超声波声场的装置

    公开(公告)号:EP0136857A3

    公开(公告)日:1986-04-23

    申请号:EP84306257

    申请日:1984-09-13

    申请人: FUJITSU LIMITED

    IPC分类号: G01H03/12 G01S15/02

    摘要: An apparatus for observing a sound field of an ultrasonic wave, including a first unit which determines characteristic values (B/A).) of a medium at each point of a predetermined region by an ultrasonic wave having a sound field of an arbitrary form and a second unit (18) which displays an output of the first unit as two-dimensional or three-dimensional distribution (20) in the predetermined region, enabling control of the form of the sound field (16) of the ultrasonic wave.

    Ultrasonic microscope system
    7.
    发明公开
    Ultrasonic microscope system 失效
    超声波显微镜系统

    公开(公告)号:EP0121890A3

    公开(公告)日:1986-01-08

    申请号:EP84103640

    申请日:1984-04-03

    IPC分类号: G01S15/89 G01N29/04 G01H03/12

    摘要: An ultrasonic transmitter-receiver (16) for radiating a focused ultrasonic beam (39) and a sample (23) are moved relative to each other in the axial direction of the ultrasonic beam. A reflected wave from the sample (23) is received and a curve V(Z) of variations in the level of the reflected wave with respect to the relative movement is obtained. A reference level of interference of a directly reflected wave and a leaky elastic wave is substracted from V(Z) to perform waveform processing. The waveform processing output is subjected to a waveform analysis, and from the analysis results, the velocity and/or the attenuation of the leaky elastic wave are calculated.

    A method and device for detecting a specific acoustic spectral feature
    8.
    发明公开
    A method and device for detecting a specific acoustic spectral feature 失效
    一种用于检测特定声学特征的方法和装置

    公开(公告)号:EP0173955A3

    公开(公告)日:1987-12-23

    申请号:EP85110806

    申请日:1985-08-28

    IPC分类号: G01H03/12 G01H13/00 G01N29/04

    CPC分类号: G01H3/12

    摘要: 57 A method and device for detecting a narrow acoustic spectral feature in a sample as described. The method uses an electrical frequency modulated (FM) signal that is obtained from a voltage controlled oscillator 58. The Fourier spectrum of this wave is a main frequency f c with two small sidebands at frequencies f c ±f s . This whole triplet is slowly swept in frequency by a slow sawtooth generator 52. The electrical signal is fed into a flat acoustic transducer 64; the acoustic wave is then transmitted through an acoustically active medium 66, i.e. the sample, and detected by another flat acoustic transducer 70 which produces an FM signal with a superposed amplitude modulated (AM) signal if one of the sideboards overlaps an acoustic feature. This electrical signal is then demodulated to give a pure AM signal which can be phase sensitive detected by using a lock-in amplifier 78. By suitable adjustment of the phase setting of the lock-in amplifier both the "in-phase" and "out-of-phase" signals of the detected acoustic signal can be detected.

    Acoustic microscope
    10.
    发明公开
    Acoustic microscope 失效
    声学显微镜

    公开(公告)号:EP0121690A3

    公开(公告)日:1985-07-31

    申请号:EP84101533

    申请日:1984-02-15

    申请人: HITACHI, LTD.

    IPC分类号: G01N29/04 G01H03/12

    CPC分类号: G01H3/125 G01N29/06

    摘要: An acoustic microscope comprising an acoustic transducer (140) which performs both generation and detection of acoustic wave beams, and a sample holding member (82) which opposes to an acoustic wave transmitting and receiving surface of the transducer (140), to hold an object sample (62) through an acoustic wave propagating medium (8) and to offer behind the sample a layer of an acoustic impedance unequal to that of the sample, so that the sample holding member (82) is moved in parallel, thereby to detect acoustic waves reflected from front and rear surfaces of the sample (62) and acoustic waves reflected from a surface of the sample holding member (82) without reaching the sample and to measure amplitudes and returning periods of time of the reflected acoustic waves, so as to measure the velocity of sound through the sample of unknown thickness, the acoustic impedance of the sample, etc. from the measured values.