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公开(公告)号:EP4471846A3
公开(公告)日:2025-02-26
申请号:EP24207811.1
申请日:2023-03-13
Applicant: Semiconductor Components Industries, LLC
Inventor: LIU, Yong , YANG, Quing
IPC: H01L23/373 , H05K1/02 , H01L23/31 , H05K3/00 , H05K7/20 , H05K7/14 , H01L25/07 , H01L23/498 , H01L23/00
Abstract: In some aspects, the techniques described herein relate to a signal distribution assembly configured to conduct signals in a semiconductor device module, the signal distribution assembly including: a metal layer, the metal layer having: a first side, the first side being planar; and a second side opposite the first side, the second side being non-planar and including: a base portion; a first post extending from the base portion; and a second post extending from the base portion. The metal layer can be pre-molded using a molding compound disposed on the second side of the metal later, with respective surfaces of the first post and the second posted exposed through the molding compound, and or the metal layer can be coupled with a thermally conductive insulator (e.g., ceramic) layer.
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公开(公告)号:EP3343604B1
公开(公告)日:2025-02-26
申请号:EP17204848.0
申请日:2017-12-01
Inventor: VAL, Christian , VAL, Alexandre
IPC: H01L23/31 , H01L23/00 , H05K3/46 , H01L23/552 , H05K1/03 , H05K3/28 , H01L23/498
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公开(公告)号:EP4510186A1
公开(公告)日:2025-02-19
申请号:EP24168505.6
申请日:2024-04-04
Applicant: Samsung Electronics Co., Ltd.
Inventor: YU, Bong Wee , KIM, Chang Soo , JEON, Byung Chul , HUH, Jun Ho
IPC: H01L25/065 , H01L23/498 , H01L23/538 , H01L25/10 , H01L25/18
Abstract: A semiconductor package is provided. The semiconductor package comprises a package substrate, a first semiconductor chip on the package substrate, a second semiconductor chip spaced apart from the first semiconductor chip on the package substrate, and a bridge die placed below the first semiconductor chip and the second semiconductor chip on the package substrate, wherein the bridge die includes a first face that faces the first semiconductor chip and the second semiconductor chip, a second face that faces the package substrate, a connection wiring structure which is placed on the first face, and connects the first semiconductor chip and the second semiconductor chip, and a power wiring structure which is placed on the second face, and provides power to the first semiconductor chip and the second semiconductor chip.
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公开(公告)号:EP4510184A1
公开(公告)日:2025-02-19
申请号:EP23192162.8
申请日:2023-08-18
Applicant: Infineon Technologies AG
Inventor: CHAJNETA, Michal , TAKKAC, Alparslan , FROEBUS, Dirk
IPC: H01L23/498
Abstract: A terminal element for a power semiconductor module arrangement comprises a first end (41) configured to be arranged inside a housing (7) of the power semiconductor module arrangement (100), a second end (42) configured to be arranged outside of the housing (7) of the power semiconductor module arrangement (100), a first section (410) and a second section (420) arranged successively between the first end (41) and the second end (42) along a length (l4) of the terminal element (4), and a third section (430) arranged between the first section (410) and the second section (420), wherein the first section (410) has a first width (w410), the second section (420) extends in a first direction (z) and has a second width (w420) that is greater than the first width (w410), and the third section (430) has a width greater than the first width (w410), and extends in a second direction (y) which is angled relative to the first direction (z).
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公开(公告)号:EP4462483A3
公开(公告)日:2025-02-19
申请号:EP24203225.8
申请日:2020-09-02
Applicant: Yangtze Memory Technologies Co., Ltd.
Inventor: XIAO, Liang , WU, Shu
IPC: H01L23/498 , H01L21/48 , H01L23/00 , H01L25/18
Abstract: Aspects of the disclosure provide a semiconductor device. The semiconductor device includes a first die and a second die boned face-to-face. The first die includes first transistors formed on a face side of the first die in a semiconductor portion and at least a contact structure disposed in an insulating portion outside the semiconductor portion. The second die includes a substrate and second transistors formed on a face side of the second die. Further, the semiconductor device includes a first pad structure disposed on a back side of the first die and the first pad structure is conductively coupled with the contact structure. An end of the contact structure protrudes from the insulating portion into the first pad structure. Further, in some embodiments, the semiconductor device includes a connection structure disposed on the back side of the first die and conductively connected with the semiconductor portion.
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公开(公告)号:EP3506347B1
公开(公告)日:2025-02-12
申请号:EP18209004.3
申请日:2018-11-28
Inventor: CHATTERJEE, Prithwish , ZHAO, Junnan , VADLAMANI, Sai , WANG, Ying , JAIN, Rahul , BROWN, Andrew J. , LINK, Lauren A. , XU, Cheng , LI, Sheng C.
IPC: H01L23/498 , H01L21/48
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公开(公告)号:EP4503124A1
公开(公告)日:2025-02-05
申请号:EP24191638.6
申请日:2024-07-30
Inventor: Mayukh, Mayank , Tendel, Shrikara , Pallinti, Jayanthi , Dix, Gregory
IPC: H01L23/498 , H01L23/15 , H01L23/00 , H01L21/48 , H01L21/683
Abstract: The subject technology is directed to semiconductor devices and manufacturing methods. In various embodiments, the subject technology provides a method for manufacturing a semiconductor device, which comprises forming a substrate and coupling a first circuit to the substrate. The first circuit is characterized by a first coefficient of thermal expansion (CTE) and the substrate is characterized by a second CTE. A ratio of the first CTE to the second CTE is greater than or equal to 3:5, which ensures harmonious thermal behavior, leading to improved yield and reduced warpage. In some implementations, one or more circuit elements may be embedded in the substrate. There are other embodiments as well.
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公开(公告)号:EP4503123A1
公开(公告)日:2025-02-05
申请号:EP24191631.1
申请日:2024-07-30
Inventor: Mayukh, Mayank , Tendel, Shrikara , Pallinti, Jayanthi , Dix, Gregory
IPC: H01L23/498 , H01L23/15 , H01L23/00
Abstract: The subject technology is directed to semiconductor devices and manufacturing methods. In various embodiments, the subject technology provides a semiconductor device, which comprises a first circuit characterized by a first coefficient of thermal expansion (CTE) and a substrate characterized by a second CTE. A ratio of the first CTE to the second CTE is greater than or equal to 3:5, which ensures harmonious thermal behavior, leading to improved yield and reduced warpage. In some implementations, one or more circuit elements may be embedded in the substrate. There are other embodiments as well.
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公开(公告)号:EP4500592A1
公开(公告)日:2025-02-05
申请号:EP23726885.9
申请日:2023-05-08
Applicant: Siemens Aktiengesellschaft
Inventor: HENSLER, Alexander , PFEFFERLEIN, Stefan , BIGL, Thomas , HEIMANN, Matthias , MÜLLER, Bernd , NACHTIGALL-SCHELLENBERG, Christian , OSCHMANN, Philipp , STROGIES, Jörg , WILKE, Klaus
IPC: H01L23/498 , H01L25/00 , H01L25/07
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公开(公告)号:EP4500591A1
公开(公告)日:2025-02-05
申请号:EP23719522.7
申请日:2023-03-24
Applicant: Texas Instruments Incorporated
Inventor: TANG, Yiqi , CHEN, Jie , GUPTA, Chittranjan Mojan , MURUGAN, Rajen Muricon
IPC: H01L23/498 , H01L23/50 , H01L23/00
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