Abstract:
PROBLEM TO BE SOLVED: To restrain an influence of crosstalk between adjacent inspection objects. SOLUTION: This probe card is provided with a plurality of probes for contacting with the inspection objects to at least input or output an electric signal, a substrate having a wiring pattern corresponding to circuit structure for generating a signal for inspection, a plurality of input conductors with one end connected electrically to any of the plurality of probes to transmit an input signal to the inspection object, a plurality of coaxial cables with one end connected electrically to the substrate, and with the other end connected electrically to any of the plurality of input conductors, or connected electrically to any of the plurality of probes, and a plurality of output conductors with one end connected electrically to any of the plurality of probes to transmit an output signal from the inspection object, and a shield plate provided in the vicinity of an area where the output conductor connected to one out of the two adjacent inspection objects intersects with the input conductor connected to the other thereof. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a probe card capable of bringing a probe into contact with a contact target reliably regardless of a temperature environment in inspection. SOLUTION: The probe card comprises: a plurality of probes that are made of a conductive material and input or output an electric signal while being in contact with an electrode pad that the semiconductor wafer has; a probe head for storing and holding the plurality of probes; a substrate having a wiring pattern corresponding to the circuit structure; and a space transformer that overlies the probe head, changes the interval of the wiring patterns that the substrate has for relaying, and has an electrode pad provided on the surface of a side opposing the probe head corresponding to the relayed wiring. Both the ends of the probe are in contact with an area near the center of the electrode pad that the semiconductor wafer and the space transformer have under environment having the average temperature between the minimum and maximum temperatures when inspecting the semiconductor wafer. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide contact probes that satisfy a desired pitch between them, and can further satisfy various characteristics such as a load characteristic, wear resistance characteristic, electric characteristic required for contact probes. SOLUTION: The contact probe has a plunger 1 in contact with an inspected object, a plunger 2 in contact with a connection terminal 31 on the side of the inspection device, and a wire 3 disposed between the plungers 1 and 2. Each of the plungers 1 and 2 having a desired characteristic selected according to the inspected object and the wire 3 having a desired characteristic selected according to the inspected object are combined with each other and mechanically interconnected using close coiling spring joints 4 and 5. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a vehicular sun shade device having good operability in use. SOLUTION: first ends of a pair of shielding members 4 folded in bellows shapes are respectively fixed to right and left both end portions of a vehicular front window MC, and moving elements 5 are coupled to second ends of the shielding members 4. Upper end portions of the moving elements 5 are engaged with a guide rail 7 extending in a lateral direction on an upper edge of the front window MC, and lower end portions are engaged with a recessed portion LG of a defroster nozzle FL formed on an instrument panel PB. While guided by the guide rail 7 and the recessed portion LG, the moving elements 5 are pulled out on the front window MC from a state retracted in the right and left ends of the front window MC. Then, the pair of moving elements 5 is individually engaged with a fixing device 8 attached to an upper end center portion of the front window MC, and fixed to cover the front window MC. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To compatibly obtain low impedance, low loss, and a wide band of wiring lines on a recording side, and high impedance, low loss, and a wide band of wiring lines on a reproduction side. SOLUTION: A head suspension 1 has: a load beam 3 which places a load on a head part 21 recording/reproducing information to and from a hard disk; and a flexure 7 which has recording-side and reproduction-side wiring lines 25 and 27 connected to the head part 21 and is fitted to the load beam 3 while supporting the head part 21, the flexure 7 having the wiring lines 25 and 27 arranged on a base material 17 of a conductive thin plate across a base insulating layer 33 made of flexible resin. The head suspension 1 is characterized in that a high-conductivity ground layer 39 of copper having higher conductivity than the base material 17 of the conductive thin plate is formed at at least a portion between the base material 17 and base insulating layer 33 corresponding to the wiring line 25 only on a width-directional recording side of the flexure 7. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To cope with narrowed arrangement interval, to facilitate visual observation of contact state with an inspection object, even from the upper part, and to achieve stable electrical contact, without applying excessive loads. SOLUTION: The conductive contactor unit is provided with a conductive contactor holder, having first guide grooves and second guide grooves holding edge end parts of the conductive contactor in the longitudinal direction, respectively; the plurality of conductive contactors, having first and second contact parts physically contacting with mutually different circuit structures, an elastic part, intervening between the first and second contact parts and expandable and contractible in the longitudinal direction; and a second connection part which connects the elastic part and the second contact part, in which the opening part through the thickness direction is formed, and which protrudes from an end part of the second guide groove, to the outside when accommodated in the conductive contactor holder; and a bar-like member, passing through the opening part formed in the second connection part included in the plurality of conductive contactors and is fixed to the conductive contactor holder. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a plasma processing device with processing efficiency and device working efficiency improved by shortening maintenance time. SOLUTION: A vacuum processing device includes a vacuum vessel in which a substrate-like specimen is placed in an internally provided and decompressed processing chamber, a conveyance vessel having the vacuum vessel coupled in which the specimen is carried in a decompressed atmosphere, a path for communicating a conveyance chamber with the processing chamber with the conveyance vessel coupled with the vacuum vessel in which the specimen before or after the processing is carried, and a detachable cover member attached to cover an inner wall surface of the path for processing the specimen in the processing chamber using plasma formed in the processing chamber. COPYRIGHT: (C)2007,JPO&INPIT