The method of manufacturing a semiconductor sealing material for the silica-alumina composite oxide ultrafine powder

    公开(公告)号:JP5345787B2

    公开(公告)日:2013-11-20

    申请号:JP2008023428

    申请日:2008-02-04

    Abstract: PROBLEM TO BE SOLVED: To provide a resin composition, especially a semiconductor sealing material, of excellent fluidity and moldability and reduced burr formation, to provide an ultrafine powder desirable therefor, and to provide a method for producing an ultrafine powder. SOLUTION: Disclosed are an ultrafine powder having a content of SiO 2 and Al 2 O 3 of 99.5 mass% or higher in terms of oxides, an average particle diameter of 0.05-1.0 μm, a coefficient of variation in a particle size distribution of 10-100%, and an ultrafine powder having a content of Al 2 O 3 of 10-99 mass% in terms of an oxide, an inorganic powder having an average particle diameter of 5-50 μm and containing 0.5-20 mass% of the above ultrafine powder, and a method for producing an ultrafine powder is one comprising heat-treating an Si source substance and an Al source substance by spraying them into a high-temperature flame formed from a combustible gas and a combustion-assisting gas, wherein the Si source substance and the Al source substance are sprayed from separate burners, and the Si source substance is sprayed from a position 1-20 cm below the position from which the Al source is sprayed. COPYRIGHT: (C)2009,JPO&INPIT

    Ceramic powder and its applications

    公开(公告)号:JP5354724B2

    公开(公告)日:2013-11-27

    申请号:JP2008515533

    申请日:2007-05-11

    Abstract: The present invention herein provides ceramic powder which is to be incorporated into rubber or a resin and which can be used as, for instance, a semiconductor-sealing material and for the preparation of a composition excellent in the narrow interstice-filling up property and moldability. The ceramic powder has a multiple peak-frequency type particle size distribution which has at least two peaks, as determined according to the laser diffraction-scattering type particle size distribution analyzer, wherein the maximum particle size observed for the first peak falls within the range of from 12 to 30µm; that observed for the second peak falls within the range of from 2 to 7µm; the content of the particles having a particle size of greater than 7µm and less than 12µm is not more than 18% (including 0%); and wherein the ratio (F2/F1) of the frequency value F2 of the maximum particle size for the second peak to that F1 of the maximum particle size for the first peak ranges from 0.5 to 1.3.

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