公开(公告)号：JP2012154932A

公开(公告)日：2012-08-16

申请号：JP2012015155

申请日：2012-01-27

Applicant: Tektronix Inc ,  テクトロニクス・インコーポレイテッドTektronix,Inc.

Inventor： SMITH PATRICK A ,  KNIERIM DANIEL G ,  CALVIN JOHN C ,  HAZZARD SHANE A

IPC: G01R13/20 ,  G01R23/12

CPC classification number: G01R13/0254 ,  G01R23/02 ,  G01R31/31727 ,  H03L7/093

Abstract: PROBLEM TO BE SOLVED: To instantaneously trigger on a frequency deviation dF/dT of an SSC signal.SOLUTION: A signal received at an input terminal 210 of a test and measurement instrument 200 is low-pass filtered and transmitted to dF/dT trigger circuitry 220. The dF/dT trigger circuitry 220 includes trigger circuitry and a PLL circuit. The trigger circuitry is connected to an output terminal of an adjustable low-pass filter in the PLL circuit, and receives a proportional path output signal of the PLL circuit. Thereby, when a frequency deviation in the filtered SSC signal exceeds or crosses one or more thresholds, the trigger circuitry produces a trigger event.

Abstract translation: 要解决的问题：立即触发SSC信号的频率偏差dF / dT。 解决方案：在测试和测量仪器200的输入端210处接收的信号被低通滤波并被发送到dF / dT触发电路220.dF / dT触发电路220包括触发电路和PLL电路。 触发电路连接到PLL电路中可调低通滤波器的输出端，并接收PLL电路的比例路径输出信号。 因此，当滤波的SSC信号中的频率偏差超过或超过一个或多个阈值时，触发电路产生触发事件。 版权所有（C）2012，JPO＆INPIT

公开(公告)号：JP2011158473A

公开(公告)日：2011-08-18

申请号：JP2011013155

申请日：2011-01-25

Applicant: Tektronix Inc ,  テクトロニクス・インコーポレイテッドTektronix,Inc.

Inventor： STEPHENS RANSOM W ,  KARAPATTU MURALIDHARAN ,  DESAI SAMPATHKUMAR R ,  CALVIN JOHN C

IPC: G01R31/3183 ,  H04L25/02

CPC classification number: G01R31/31709

Abstract: PROBLEM TO BE SOLVED: To generate a waveform test signal having the crest factor emulation of a random jitter. SOLUTION: A CPU 60 generates a user interface on a display unit 56 and sets a parameter for a serial data pattern and parameters for a data ministick jitter defect given to the serial data pattern, a random jitter defect, and a random jitter defect and at least one deviation crest factor emulation defect. Using these parameters, a waveform record file is generated to keep a deviation crest factor emulation defect selectively positioned in the defect serial data pattern. A waveform generation circuit 70 generates a defective serial data pattern analog output signal based on the defects. A displaced crest factor emulation defect is selectively positioned at the defective serial data pattern analog output signal. COPYRIGHT: (C)2011,JPO&INPIT

Abstract translation: 要解决的问题：产生具有随机抖动的波峰因数仿真的波形测试信号。 解决方案：CPU60在显示单元56上生成用户接口，并且为串行数据模式设置串行数据模式的参数和数据分组抖动缺陷的参数，随机抖动缺陷和随机抖动 缺陷和至少一个偏差波峰因数仿真缺陷。 使用这些参数，生成波形记录文件，以保持偏差波峰因数仿真缺陷有选择地位于缺陷串行数据模式中。 波形发生电路70基于缺陷产生有缺陷的串行数据模式模拟输出信号。 偏移的波峰因数仿真缺陷被选择性地定位在有缺陷的串行数据模式模拟输出信号上。 版权所有（C）2011，JPO＆INPIT

公开(公告)号：JP2007147619A

公开(公告)日：2007-06-14

申请号：JP2006316124

申请日：2006-11-22

Applicant: Tektronix Inc ,  テクトロニクス・インコーポレイテッドTektronix,Inc.

Inventor： TAN KAN ,  CALVIN JOHN C ,  SEPP KALEV

IPC: G01R29/02

Abstract: PROBLEM TO BE SOLVED: To effectively measure a transport delay and jitters by using a real-time oscilloscope based on cross-correlation.
SOLUTION: Waveforms at two test points of a system to be tested are fetched (Step 1). The constant clocks of the two waveforms are reproduced, and each offset value is found (Steps 2, 3). The time offset between the individual offset values is calculated (Step 4). Jitters from the two test points are filtered (Step 5), and an average removal cross-correlation coefficient between the filtered jitters from the two test points is calculated (Step 6). The time offset and the average removal cross-correlation coefficient are added, and a transport delay is computed (Step 8).
COPYRIGHT: (C)2007,JPO&INPIT

Abstract translation: 要解决的问题：通过使用基于互相关的实时示波器有效地测量传输延迟和抖动。

解决方案：要测试的系统的两个测试点的波形被取出（步骤1）。 再现两个波形的恒定时钟，并找到每个偏移值（步骤2,3）。 计算各个偏移值之间的时间偏移（步骤4）。 对两个测试点的抖动进行滤波（步骤5），并且计算来自两个测试点的滤波抖动之间的平均去除互相关系数（步骤6）。 添加时间偏移和平均去除互相关系数，计算传输延迟（步骤8）。 版权所有（C）2007，JPO＆INPIT

公开(公告)号：JP2003232813A

公开(公告)日：2003-08-22

申请号：JP2003000642

申请日：2003-01-06

Applicant: TEKTRONIX INC

Inventor： CUSHING KELLY F ,  NIGHTINGALE MARK W ,  STOOPS JOHN F ,  CALVIN JOHN C ,  GESSFORD MARC A ,  OTTUM MARIE

IPC: G01R13/28 ,  G01R1/04 ,  G01R1/067 ,  G01R13/20 ,  G01R31/319

Abstract: PROBLEM TO BE SOLVED: To supply a plurality of probes with time-aligned signals when performing deskew adjustment of the plurality of measuring probes. SOLUTION: A signal launch contact 16 (18, 19) and probe holders 24, 26 are arranged in the mirror connection on opposite faces of a multilayer circuit substrate 12. A first pair 18 of the signal launch contact is earthed, and a second pair 19 is coupled with a signal source through an electromagnetic coupling strip line having the equal length. The probe holders support each measuring probe on the circuit substrate and couples each probe contact of the measuring probes with the signal launch contact. COPYRIGHT: (C)2003,JPO