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1.发明申请Semiconductor memory device capable of storing data of various patterns and method of electrically testing the semiconductor memory device 失效能够存储各种图案的数据的半导体存储器件以及对半导体存储器件进行电测试的方法公开(公告)号：US20060098506A1
公开(公告)日：2006-05-11
申请号：US11267203
申请日：2005-11-04
申请人： Gyu-Yeol Kim , Sang-Man Byun , Yong-Gyu Chu , Seok-Ho Park
发明人： Gyu-Yeol Kim , Sang-Man Byun , Yong-Gyu Chu , Seok-Ho Park
IPC分类号： G11C29/00
CPC分类号： G11C29/48 , G11C29/10 , G11C29/1201
摘要： A semiconductor memory device to which information of different data bits can be written, and a method of electrically testing the semiconductor memory device are provided. In a mode for testing a memory cell array of the semiconductor memory device, the semiconductor memory comprises a control signal generation pad capable of writing non-identical data to data input/output pads of each group when data is written to the memory cell array.
摘要翻译： 提供可以写入不同数据位的信息的半导体存储器件，以及电半导体存储器件的电测试方法。 在用于测试半导体存储器件的存储单元阵列的模式中，半导体存储器包括一个控制信号生成焊盘，当数据被写入存储单元阵列时，该控制信号产生焊盘能够将不相同的数据写入每个组的数据输入/输出焊盘。
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2.发明申请SEMICONDUCTOR MEMORY DEVICE CAPABLE OF STORING DATA OF VARIOUS PATTERNS AND METHOD OF ELECTRICALLY TESTING THE SEMICONDUCTOR MEMORY DEVICE 审中-公开能够存储各种图案的数据的半导体存储器件和电子测试半导体存储器件的方法公开(公告)号：US20080316846A1
公开(公告)日：2008-12-25
申请号：US12201996
申请日：2008-08-29
申请人： Gyu-Yeol KIM , Sang-Man BYUN , Yong-Gyu CHU , Seok-Ho PARK
发明人： Gyu-Yeol KIM , Sang-Man BYUN , Yong-Gyu CHU , Seok-Ho PARK
CPC分类号： G11C29/48 , G11C29/10 , G11C29/1201
摘要： A semiconductor memory device to which information of different data bits can be written, and a method of electrically testing the semiconductor memory device are provided. In a mode for testing a memory cell array of the semiconductor memory device, the semiconductor memory comprises a control signal generation pad capable of writing non-identical data to data input/output pads of each group when data is written to the memory cell array.
摘要翻译： 提供可以写入不同数据位的信息的半导体存储器件，以及电半导体存储器件的电测试方法。 在用于测试半导体存储器件的存储单元阵列的模式中，半导体存储器包括一个控制信号生成焊盘，当数据被写入存储单元阵列时，该控制信号产生焊盘能够将不相同的数据写入每个组的数据输入/输出焊盘。
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3.发明授权Electrical signal transmission module, method of transmitting electric signals and electrical inspection apparatus having the same 有权电信号传输模块，发送电信号的方法和具有该信号的电气检查装置公开(公告)号：US08139949B2
公开(公告)日：2012-03-20
申请号：US12179015
申请日：2008-07-24
申请人： Sang-Hoon Lee , Ho-Jeong Choi , Se-Jang Oh , Young-Soo An , Gyu-Yeol Kim
发明人： Sang-Hoon Lee , Ho-Jeong Choi , Se-Jang Oh , Young-Soo An , Gyu-Yeol Kim
IPC分类号： H04B10/12
CPC分类号： H04B10/2504 , G01R31/2889 , H04B10/801
摘要： An electrical signal transmission module includes a plurality of optical signal lines and a plurality of electrical signal lines. The plurality of optical signal lines converting a first externally input electrical signal into an optical signal, transmitting the optical signal, converting the optical signal back into the first electrical signal, and outputting the first electrical signal. The plurality of electrical signal lines transmitting a second externally input electrical signal and outputting the second electrical signal.
摘要翻译： 电信号传输模块包括多个光信号线和多个电信号线。 多个光信号线将第一外部输入的电信号转换为光信号，发送光信号，将光信号转换回第一电信号，并输出第一电信号。 多个电信号线发送第二外部输入电信号并输出第二电信号。
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4.发明申请ELECTRICAL SIGNAL TRANSMISSION MODULE, METHOD OF TRANSMITTING ELECTRIC SIGNALS AND ELECTRICAL INSPECTION APPARATUS HAVING THE SAME 有权电子信号传输模块，发送电信号的方法和具有该信号的电子检测装置公开(公告)号：US20090028571A1
公开(公告)日：2009-01-29
申请号：US12179015
申请日：2008-07-24
申请人： Sang-Hoon Lee , Ho-Jeong Choi , Se-Jang Oh , Young-Soo An , Gyu-Yeol Kim
发明人： Sang-Hoon Lee , Ho-Jeong Choi , Se-Jang Oh , Young-Soo An , Gyu-Yeol Kim
IPC分类号： H04B10/00
CPC分类号： H04B10/2504 , G01R31/2889 , H04B10/801
摘要： An electrical signal transmission module includes a plurality of optical signal lines and a plurality of electrical signal lines. The plurality of optical signal lines converting a first externally input electrical signal into an optical signal, transmitting the optical signal, converting the optical signal back into the first electrical signal, and outputting the first electrical signal. The plurality of electrical signal lines transmitting a second externally input electrical signal and outputting the second electrical signal.
摘要翻译： 电信号传输模块包括多个光信号线和多个电信号线。 多个光信号线将第一外部输入的电信号转换为光信号，发送光信号，将光信号转换回第一电信号，并输出第一电信号。 多个电信号线发送第二外部输入电信号并输出第二电信号。
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5.发明授权Semiconductor memory device capable of storing data of various patterns and method of electrically testing the semiconductor memory device 失效能够存储各种图案的数据的半导体存储器件以及对半导体存储器件进行电测试的方法公开(公告)号：US07433252B2
公开(公告)日：2008-10-07
申请号：US11267203
申请日：2005-11-04
申请人： Gyu-Yeol Kim , Sang-Man Byun , Yong-Gyu Chu , Seok-Ho Park
发明人： Gyu-Yeol Kim , Sang-Man Byun , Yong-Gyu Chu , Seok-Ho Park
IPC分类号： G11C29/00
CPC分类号： G11C29/48 , G11C29/10 , G11C29/1201
摘要： A semiconductor memory device to which information of different data bits can be written, and a method of electrically testing the semiconductor memory device are provided. In a mode for testing a memory cell array of the semiconductor memory device, the semiconductor memory comprises a control signal generation pad capable of writing non-identical data to data input/output pads of each group when data is written to the memory cell array.
摘要翻译： 提供可以写入不同数据位的信息的半导体存储器件，以及电半导体存储器件的电测试方法。 在用于测试半导体存储器件的存储单元阵列的模式中，半导体存储器包括一个控制信号生成焊盘，当数据被写入存储单元阵列时，该控制信号产生焊盘能够将不相同的数据写入每个组的数据输入/输出焊盘。
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