Probe Card And Manufacturing Method Therefor
    1.
    发明申请
    Probe Card And Manufacturing Method Therefor 审中-公开
    探针卡及其制造方法

    公开(公告)号:US20130265073A1

    公开(公告)日:2013-10-10

    申请号:US13993690

    申请日:2011-01-16

    IPC分类号: G01R3/00 G01R1/073

    摘要: The present invention provides a ST board 2 that is formed with an lower surface electrode 22; a unit attachment plate 3 that is fastened on the ST board 2 and formed with an opening part 31 exposing the lower surface electrode 22; a probe unit 5 that includes a probe substrate 50 formed with a contact probe 51 and a probe electrode 52 and is fastened on the unit attachment plate 3; and an electrically conductive wire 54 that connects the lower surface electrode 22 and the probe electrode 52 to each other through the opening part 31. The probe unit 5 can be fastened on the ST board 2 with the unit attachment plate 3 intervening, and through the opening part 31 of the unit attachment plate 3, the probe electrode 51 and the lower surface electrode 22 can be electrically connected to each other.

    摘要翻译: 本发明提供一种形成有下表面电极22的ST板2, 固定在ST板2上并形成有露出下表面电极22的开口部31的单元附接板3; 探针单元5,其包括形成有接触探针51和探针电极52的探针基板50,并且紧固在单元安装板3上; 以及通过开口部31将下表面电极22和探针电极52相互连接的导电线54.探针单元5可以在单元安装板3插入的状态下紧固在ST板2上,并且通过 单元安装板3的开口部31,探针电极51和下表面电极22可以彼此电连接。