公开(公告)号：US20210349797A1

公开(公告)日：2021-11-11

申请号：US17379442

申请日：2021-07-19

Applicant: ADVANCED MICRO DEVICES, INC.

Inventor： AMITABH MEHRA ,  ANIL HARWANI ,  WILLIAM R. ALVERSON ,  GRANT E. LEY ,  JERRY A. AHRENS ,  MUSTANSIR M. PRATAPGARHWALA ,  SCOTT E. SWANSTROM

IPC: G06F11/22

Abstract: Automatic part testing includes: booting a part under testing into a first operating environment; executing, via the first operating environment, one or more test patterns on the part; performing a comparison between one or more observed characteristics associated with the one or more test patterns and one or more expected characteristics; and modifying one or more operational parameters of a central processing unit of the part based on the comparison.

公开(公告)号：US20210182163A1

公开(公告)日：2021-06-17

申请号：US16715831

申请日：2019-12-16

Applicant: ADVANCED MICRO DEVICES, INC.

Inventor： AMITABH MEHRA ,  ANIL HARWANI ,  WILLIAM R. ALVERSON ,  GRANT E. LEY ,  JERRY A. AHRENS ,  MUSTANSIR M. PRATAPGARHWALA ,  SCOTT E. SWANSTROM

IPC: G06F11/22 ,  G06F21/57

Abstract: Automatic part testing includes: booting a part under testing into a first operating environment; executing, via the first operating environment, one or more test patterns on the part; performing a comparison between one or more observed characteristics associated with the one or more test patterns and one or more expected characteristics; and modifying one or more operational parameters of a central processing unit of the part based on the comparison.