公开(公告)号：US20220155982A1

公开(公告)日：2022-05-19

申请号：US17591924

申请日：2022-02-03

Applicant: ADVANCED MICRO DEVICES, INC.

Inventor： WILLIAM R. ALVERSON ,  AMITABH MEHRA ,  ANIL HARWANI ,  JERRY A. AHRENS ,  GRANT E. LEY ,  JAYESH JOSHI

IPC: G06F3/06 ,  G11C29/10

Abstract: Automatic memory overclocking, including: increasing a memory frequency setting for a memory module until a memory stability test fails; determining an overclocked memory frequency setting including a highest memory frequency setting passing the memory stability test; and generating a profile including the overclocked memory frequency setting.

公开(公告)号：US20210349797A1

公开(公告)日：2021-11-11

申请号：US17379442

申请日：2021-07-19

Applicant: ADVANCED MICRO DEVICES, INC.

Inventor： AMITABH MEHRA ,  ANIL HARWANI ,  WILLIAM R. ALVERSON ,  GRANT E. LEY ,  JERRY A. AHRENS ,  MUSTANSIR M. PRATAPGARHWALA ,  SCOTT E. SWANSTROM

IPC: G06F11/22

Abstract: Automatic part testing includes: booting a part under testing into a first operating environment; executing, via the first operating environment, one or more test patterns on the part; performing a comparison between one or more observed characteristics associated with the one or more test patterns and one or more expected characteristics; and modifying one or more operational parameters of a central processing unit of the part based on the comparison.

公开(公告)号：US20210191778A1

公开(公告)日：2021-06-24

申请号：US16723427

申请日：2019-12-20

Applicant: ADVANCED MICRO DEVICES, INC.

Inventor： ANIL HARWANI ,  AMITABH MEHRA ,  WILLIAM R. ALVERSON ,  GRANT E. LEY ,  JERRY A. AHRENS ,  KENNETH MITCHELL

IPC: G06F9/50 ,  G06F9/48 ,  G06F11/34 ,  G06F11/30

Abstract: Automatic central processing unit (CPU) usage optimization includes: monitoring performance activity of a workload comprising a plurality of threads; and modifying a resource allocation of a plurality of cores for the plurality of threads based on the performance activity.

公开(公告)号：US20230004185A1

公开(公告)日：2023-01-05

申请号：US17940490

申请日：2022-09-08

Applicant: ADVANCED MICRO DEVICES, INC.

Inventor： AMITABH MEHRA ,  RICHARD MARTIN BORN ,  SRIRAM SRINIVASAN ,  SNEHA KOMATIREDDY ,  MICHAEL L. GOLDEN ,  XIUTING KALEEN C. MAN ,  GOKUL SUBRAMANI RAMALINGAM LAKSHMI DEVI ,  XIAOJIE HE

IPC: G06F1/10 ,  G06F1/3206

Abstract: Methods and apparatuses control electrical current supplied to a plurality of processing units in a multi-processor system. A plurality of current usage information corresponding to the processing units are received by a controller to determine a threshold current for each of the processing units. The controller determines a frequency reduction action and an instructions-per-cycle (IPC) reduction action for the each of the processing units based on the threshold current and regulates operations of the processing units based on the determined frequency and IPC reduction actions.

公开(公告)号：US20210200456A1

公开(公告)日：2021-07-01

申请号：US16729702

申请日：2019-12-30

Applicant: ADVANCED MICRO DEVICES, INC.

Inventor： WILLIAM R. ALVERSON ,  AMITABH MEHRA ,  ANIL HARWANI ,  JERRY A. AHRENS ,  GRANT E. LEY ,  JAYESH JOSHI

IPC: G06F3/06 ,  G11C29/10

Abstract: Automatic memory overclocking, including: increasing a memory frequency setting for a memory module until a memory stability test fails; determining an overclocked memory frequency setting including a highest memory frequency setting passing the memory stability test; and generating a profile including the overclocked memory frequency setting.

公开(公告)号：US20210182163A1

公开(公告)日：2021-06-17

申请号：US16715831

申请日：2019-12-16

Applicant: ADVANCED MICRO DEVICES, INC.

Inventor： AMITABH MEHRA ,  ANIL HARWANI ,  WILLIAM R. ALVERSON ,  GRANT E. LEY ,  JERRY A. AHRENS ,  MUSTANSIR M. PRATAPGARHWALA ,  SCOTT E. SWANSTROM

IPC: G06F11/22 ,  G06F21/57

Abstract: Automatic part testing includes: booting a part under testing into a first operating environment; executing, via the first operating environment, one or more test patterns on the part; performing a comparison between one or more observed characteristics associated with the one or more test patterns and one or more expected characteristics; and modifying one or more operational parameters of a central processing unit of the part based on the comparison.

公开(公告)号：US20210181825A1

公开(公告)日：2021-06-17

申请号：US16715184

申请日：2019-12-16

Applicant: ADVANCED MICRO DEVICES, INC. ,  ATI TECHNOLOGIES ULC

Inventor： JERRY A. AHRENS ,  AMITABH MEHRA ,  ANIL HARWANI ,  WILLIAM R. ALVERSON ,  GRANT E. LEY ,  CHARLES SY LEE

IPC: G06F1/3234

Abstract: Automatic voltage reconfiguration in a computer processor including one or more cores includes executing one or more user-specified workloads; determining, based on the user-specified workloads, a respective minimum safe voltage for each core of one or more cores; and modifying a respective voltage configuration for each core of the one or more cores based on the respective minimum safe voltage.