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公开(公告)号:US20220155982A1
公开(公告)日:2022-05-19
申请号:US17591924
申请日:2022-02-03
Applicant: ADVANCED MICRO DEVICES, INC.
Inventor: WILLIAM R. ALVERSON , AMITABH MEHRA , ANIL HARWANI , JERRY A. AHRENS , GRANT E. LEY , JAYESH JOSHI
Abstract: Automatic memory overclocking, including: increasing a memory frequency setting for a memory module until a memory stability test fails; determining an overclocked memory frequency setting including a highest memory frequency setting passing the memory stability test; and generating a profile including the overclocked memory frequency setting.
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公开(公告)号:US20210349797A1
公开(公告)日:2021-11-11
申请号:US17379442
申请日:2021-07-19
Applicant: ADVANCED MICRO DEVICES, INC.
Inventor: AMITABH MEHRA , ANIL HARWANI , WILLIAM R. ALVERSON , GRANT E. LEY , JERRY A. AHRENS , MUSTANSIR M. PRATAPGARHWALA , SCOTT E. SWANSTROM
IPC: G06F11/22
Abstract: Automatic part testing includes: booting a part under testing into a first operating environment; executing, via the first operating environment, one or more test patterns on the part; performing a comparison between one or more observed characteristics associated with the one or more test patterns and one or more expected characteristics; and modifying one or more operational parameters of a central processing unit of the part based on the comparison.
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公开(公告)号:US20210191778A1
公开(公告)日:2021-06-24
申请号:US16723427
申请日:2019-12-20
Applicant: ADVANCED MICRO DEVICES, INC.
Inventor: ANIL HARWANI , AMITABH MEHRA , WILLIAM R. ALVERSON , GRANT E. LEY , JERRY A. AHRENS , KENNETH MITCHELL
Abstract: Automatic central processing unit (CPU) usage optimization includes: monitoring performance activity of a workload comprising a plurality of threads; and modifying a resource allocation of a plurality of cores for the plurality of threads based on the performance activity.
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公开(公告)号:US20210200456A1
公开(公告)日:2021-07-01
申请号:US16729702
申请日:2019-12-30
Applicant: ADVANCED MICRO DEVICES, INC.
Inventor: WILLIAM R. ALVERSON , AMITABH MEHRA , ANIL HARWANI , JERRY A. AHRENS , GRANT E. LEY , JAYESH JOSHI
Abstract: Automatic memory overclocking, including: increasing a memory frequency setting for a memory module until a memory stability test fails; determining an overclocked memory frequency setting including a highest memory frequency setting passing the memory stability test; and generating a profile including the overclocked memory frequency setting.
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公开(公告)号:US20210182163A1
公开(公告)日:2021-06-17
申请号:US16715831
申请日:2019-12-16
Applicant: ADVANCED MICRO DEVICES, INC.
Inventor: AMITABH MEHRA , ANIL HARWANI , WILLIAM R. ALVERSON , GRANT E. LEY , JERRY A. AHRENS , MUSTANSIR M. PRATAPGARHWALA , SCOTT E. SWANSTROM
Abstract: Automatic part testing includes: booting a part under testing into a first operating environment; executing, via the first operating environment, one or more test patterns on the part; performing a comparison between one or more observed characteristics associated with the one or more test patterns and one or more expected characteristics; and modifying one or more operational parameters of a central processing unit of the part based on the comparison.
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公开(公告)号:US20210181825A1
公开(公告)日:2021-06-17
申请号:US16715184
申请日:2019-12-16
Applicant: ADVANCED MICRO DEVICES, INC. , ATI TECHNOLOGIES ULC
Inventor: JERRY A. AHRENS , AMITABH MEHRA , ANIL HARWANI , WILLIAM R. ALVERSON , GRANT E. LEY , CHARLES SY LEE
IPC: G06F1/3234
Abstract: Automatic voltage reconfiguration in a computer processor including one or more cores includes executing one or more user-specified workloads; determining, based on the user-specified workloads, a respective minimum safe voltage for each core of one or more cores; and modifying a respective voltage configuration for each core of the one or more cores based on the respective minimum safe voltage.
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