TECHNIQUES AND CIRCUITS FOR TESTING A VIRTUAL POWER SUPPLY AT AN INTEGRATED CIRCUIT DEVICE
    2.
    发明申请
    TECHNIQUES AND CIRCUITS FOR TESTING A VIRTUAL POWER SUPPLY AT AN INTEGRATED CIRCUIT DEVICE 有权
    在集成电路设备中测试虚拟电源的技术和电路

    公开(公告)号:US20150022218A1

    公开(公告)日:2015-01-22

    申请号:US13946107

    申请日:2013-07-19

    CPC classification number: G01R31/2884

    Abstract: A power grid provides power to one or more modules of an integrated circuit device via a virtual power supply signal. A test module is configured to respond to assertion of a test signal so that, when the power grid is working properly and is not power gated, an output of the test module matches the virtual power supply. When the power grid is not working properly, the output of the test module is a fixed logic signal that does not vary based on the power gated state of the one or more modules.

    Abstract translation: 电力网通过虚拟电源信号向集成电路装置的一个或多个模块供电。 测试模块被配置为响应测试信号的断言,使得当电网正常工作并且不是电源门控时,测试模块的输出与虚拟电源匹配。 当电网不能正常工作时,测试模块的输出是固定的逻辑信号,它不会根据一个或多个模块的电源门控状态而变化。

Patent Agency Ranking