Printed Circuits With Sacrificial Test Structures
    1.
    发明申请
    Printed Circuits With Sacrificial Test Structures 有权
    具有牺牲测试结构的印刷电路

    公开(公告)号:US20150212114A1

    公开(公告)日:2015-07-30

    申请号:US14164769

    申请日:2014-01-27

    Applicant: Apple Inc.

    Abstract: Electrical components may be soldered to a printed circuit. The printed circuit may have an edge with an opening. Printed circuit contacts in the opening may be configured to form electrical connections with mating contacts on a flexible printed circuit or other external structure. A tester may test the electrical components by conveying signals through the contacts. Following testing, the external structure may be removed from the opening. The opening may then be filled with dielectric to isolate the printed circuit contacts. A printed circuit may have traces that extend under a ground on a surface of the printed circuit, may have edge test points formed from contacts that are cut in half when removing portions of the printed circuit, or may have through-mold vias that are formed through encapsulant over the electrical components.

    Abstract translation: 电气部件可以焊接到印刷电路。 印刷电路可以具有带开口的边缘。 开口中的印刷电路触点可以被配置为与柔性印刷电路或其它外部结构上的配合触点形成电连接。 测试人员可以通过传送信号通过触点来测试电气元件。 在测试之后,外部结构可以从开口移除。 然后可以用绝缘体填充开口以隔离印刷电路触点。 印刷电路可以具有在印刷电路表面上在地下延伸的迹线,可以具有由去除印刷电路的部分时切成两半的接触形成的边缘测试点,或者可以具有形成的通孔模具 通过电气元件上的密封剂。

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