-
公开(公告)号:US11012643B2
公开(公告)日:2021-05-18
申请号:US15379519
申请日:2016-12-15
Applicant: Applied Spectral Imaging Ltd.
Inventor: Nir Katzir
IPC: H04N5/33 , G01J3/453 , G01J3/51 , G01J3/26 , G01B9/02 , G02B26/00 , H04N9/04 , G01J3/02 , G01J3/28 , G01J3/45 , G06T5/00 , H01L27/146
Abstract: A spectral imaging system comprises: a sequential optical system providing a temporal sequence of output light beams describing the scene; a color imager receiving the output light beams and responsively generating, for each output light beam, an image signal that is spatially resolved into a plurality of color channels. The system can also comprise an image processor that collectively process the image signals to construct a spectral image of the scene.
-
公开(公告)号:US09915565B2
公开(公告)日:2018-03-13
申请号:US14438641
申请日:2013-10-24
Applicant: Applied Spectral Imaging Ltd.
Inventor: Nir Katzir
CPC classification number: G01J3/4532 , G01J3/0237 , G01J3/0297 , G01J3/2823 , G01J3/45 , G02B27/144
Abstract: A method of calibrating a spectral imaging system is disclosed. The spectral imaging system comprises an interferometer having a beam splitter and at least a first reflector and a second reflector. The method comprises: obtaining data pertaining to an interference pattern model, operating the spectral imaging system to provide an interference pattern of a received light beam, and varying a relative orientation between at least two of: the beam splitter, the first reflector and the second reflector, until the interference pattern of the input light beam substantially matches the interference pattern model.
-
公开(公告)号:US20150285686A1
公开(公告)日:2015-10-08
申请号:US14438641
申请日:2013-10-24
Applicant: APPLIED SPECTRAL IMAGING LTD.
Inventor: Nir Katzir
CPC classification number: G01J3/4532 , G01J3/0237 , G01J3/0297 , G01J3/2823 , G01J3/45 , G02B27/144
Abstract: A method of calibrating a spectral imaging system is disclosed. The spectral imaging system comprises an interferometer having a beam splitter and at least a first reflector and a second reflector. The method comprises: obtaining data pertaining to an interference pattern model, operating the spectral imaging system to provide an interference pattern of a received light beam, and varying a relative orientation between at least two of: the beam splitter, the first reflector and the second reflector, until the interference pattern of the input light beam substantially matches the interference pattern model.
Abstract translation: 公开了一种校准光谱成像系统的方法。 光谱成像系统包括具有分束器和至少第一反射器和第二反射器的干涉仪。 该方法包括:获得与干涉图案模型相关的数据,操作光谱成像系统以提供接收光束的干涉图案,以及改变以下中的至少两个之间的相对取向:分束器,第一反射器和第二反射器 反射器,直到输入光束的干涉图案基本上与干涉图案模型相匹配。
-
-