QUALITY CONTROL OF THE FRIT FOR OLED SEALING
    1.
    发明申请
    QUALITY CONTROL OF THE FRIT FOR OLED SEALING 审中-公开
    OLED密封件的质量控制

    公开(公告)号:US20100118912A1

    公开(公告)日:2010-05-13

    申请号:US12267737

    申请日:2008-11-10

    IPC分类号: G01N25/18

    CPC分类号: G01N25/72 H01L51/5246

    摘要: A method of finding defects in sealing material formed as a frame line on a glass plate includes irradiating the frame line of sealing material. A temperature of the irradiated sealing material is measured and a change of the temperature caused by a nonuniformity in sealing material is detected. Another aspect features a method of hermetically sealing a thin film device between glass plates. Sealing material is dispensed on a cover glass plate in the form of a frame line cell. The sealing material is pre-sintered onto the cover glass plate and cooled. A laser beam is moved around the frame line on the sealing material. A temperature of the sealing material contacted with the laser beam is measured. A change in the temperature (ΔT) caused by a nonuniformity in the sealing material is measured. Further aspects include a feedback process, infrared imaging and use of delta temperature data to increase sensitivity of temperature measurement data.

    摘要翻译: 在玻璃板上形成为框线的密封材料中发现缺陷的方法包括照射密封材料的框线。 测量照射的密封材料的温度,并检测由密封材料不均匀引起的温度变化。 另一方面的特征在于在玻璃板之间气密密封薄膜装置的方法。 密封材料以框线形电池的形式分配在盖玻璃板上。 将密封材料预先烧结到盖玻璃板上并冷却。 激光束围绕密封材料上的框架线移动。 测量与激光束接触的密封材料的温度。 测量由密封材料不均匀引起的温度变化(&Dgr; T)。 其他方面包括反馈过程,红外成像和使用增量温度数据以增加温度测量数据的灵敏度。