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公开(公告)号：US20250069873A1
公开(公告)日：2025-02-27
申请号：US18725973
申请日：2022-12-22
Applicant: DH Technologies Development Pte. Ltd.
Inventor： Gordana IVOSEV , Chang LIU , David M. COX
IPC: H01J49/00
Abstract: A method and system for detecting a signal measurement error, the method including providing a well plate including error correction wells and sample wells, each sample well including a single sample, and each error correction well including a mixture of samples from two or more sample wells. The method includes receiving an aliquot from the wells at a sample receiver, measuring a signal for the received aliquot, calculating an expected signal for each of the error correction wells, comparing the measured signal to the calculated expected signal for each error correction well, and determining whether an error exists in the signal of at least one sample well. When the error exists, the method correlates the error to one or more sample wells.
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公开(公告)号：US20240331990A1
公开(公告)日：2024-10-03
申请号：US18293148
申请日：2022-07-28
Applicant: DH Technologies Development Pte. Ltd.
Inventor： Gordana IVOSEV , Eva DUCHOSLAV
CPC classification number: H01J49/0036 , G06V10/52
Abstract: A method for identifying peaks in a mass spectrum is provided. The method includes: accessing a mass spectrum (300), having an intensity signal, generated for analysis of a sample; performing a wavelet transformation on the intensity signal to generate a wavelet space representation (310) of the intensity signal; generating a scale-space-processing (SSP) response signal (412, 414, 416) from the wavelet space representation of the intensity signal, wherein the SSP response signal (412, 414, 416) represents the SSP response from the wavelet scale representation (310) at different wavelet scales for a particular m/z starting position (312, 314, 316); identifying a first wavelet scale for a first local maximum in the SSP response signal; based on the first wavelet scale, detect a first baseline intensity signal; subtracting the first baseline intensity signal from the intensity signal to generate a first adjusted intensity signal; and detecting one or more peaks in the first adjusted intensity signal.
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公开(公告)号：US20230282469A1
公开(公告)日：2023-09-07
申请号：US18040774
申请日：2021-08-06
Applicant: Nic BLOOMFIELD , Gordana IVOSEV , Pavel RYUMIN , DH TECHNOLOGIES DEVELOPMENT PTE. LTD.
Inventor： Nic BLOOMFIELD , Gordana IVOSEV , Pavel RYUMIN
IPC: H01J49/00
CPC classification number: H01J49/0036
Abstract: A method for assigning charge state in mass spectrometry includes receiving a detector response signal corresponding to a plurality of ion arrival events. The detector response signal includes information related to individual ion responses generated by a detector for each ion arrival event. Detector response profiles are generated for mass-to-charge (m/z) bins of a mass spectrum generated from the ion arrival events based on the detector response signal. The m/z bins are grouped into a plurality of groups based on a similarity of the detector response profiles of the m/z bins. A charge state is assigned to one or more features based on the groups of m/z bins.
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4.发明申请公开(公告)号：US20240418686A1
公开(公告)日：2024-12-19
申请号：US18688485
申请日：2022-09-02
Applicant: DH Technologies Development Pte. Ltd.
Inventor： Chang LIU , Gordana IVOSEV , Alandra QUINN
Abstract: Methods and systems for assessing a quality of mass analysis data generated by a mass analysis device, including collecting mass spectrometry data for a given compound, deriving a measured isotope profile based on the collected mass spectrometry data, determining a predicted isotope profile, determining a first quality score for the mass analysis data, the first quality score being based on a relationship between an intensity of the main peak and intensities of the one or more isotope peaks, determining a second quality score for the mass analysis data, the second quality score being based on a signal-to-noise ratio of the mass analysis data, determining an overall quality score as a combination of the first quality score and the second quality score, and assessing a quality of a compound library based on the determined overall quality score.
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公开(公告)号：US20240347331A1
公开(公告)日：2024-10-17
申请号：US18682218
申请日：2022-08-10
Applicant: DH Technologies Development Pte. Ltd.
Inventor： Gordana IVOSEV , Nic BLOOMFIELD
IPC: H01J49/00
CPC classification number: H01J49/0045
Abstract: Methods for correlating a product ion in a mass spectrum to a precursor ion are disclosed herein, comprising determining a precursor ion ml z corresponding to the product ion as an m/z at which the product ion appears in a maximum amount of the series of mass spectra. Methods also can comprise obtaining a series of mass spectra for a sample across a mass range, each of the series of mass spectra having a precursor ion transmission window defined by a width (W) that overlaps with that of at least two of the series of mass spectra by a step size (S).
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Patent Agency Ranking
公开(公告)号：US20250014880A1
公开(公告)日：2025-01-09
申请号：US18711346
申请日：2022-11-21
Applicant: DH Technologies Development Pte. Ltd.
Inventor： Gordana IVOSEV , Nic G. BLOOMFIELD
Abstract: Ion intensities measured by an ADC detector subsystem are filtered using equivalent TDC event realizations. In one embodiment, an intensity measurement is received for at least one ion made by an ADC detector subsystem for each of m extractions of an ion beam, producing m intensities for the ion. Equivalent TDC event realizations are received for the ion for each intensity of the m intensities, producing m equivalent TDC event realizations. A filtered intensity for the ion is calculated that is a combination of the m intensities and the m event realizations. In another embodiment, for the ion, an equivalent TDC event realization is accumulated for ion events up to a threshold count of event realizations, N, and the ADC intensities are accumulated for all remaining ion events. A filtered intensity for the ion is calculated that is a combination of the equivalent TDC event realization and the ADC intensities.
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公开(公告)号：US20240355605A1
公开(公告)日：2024-10-24
申请号：US18688423
申请日：2022-09-02
Applicant: DH Technologies Development Pte. Ltd.
Inventor： Yves LE BLANC , Gordana IVOSEV
IPC: H01J49/00 , G01N27/623 , G01N27/624
CPC classification number: H01J49/005 , G01N27/623 , G01N27/624 , H01J49/0036
Abstract: A method for improved mass spectrometry by determining charge state of precursor ions from an analysis of product ions, includes receiving sample ions. A group of precursor ions is selected from the received sample ions based on mobility. A fragmentation device fragments the group of precursor ions to produce a group of product ions. A tandem mass spectrometry analysis is performed on the group of product ions to generate an intensity and mass-to-charge ratio (m/z) of the group of product ions. An ionogram is generated, based on the generated intensities and mass, to charge ratios for the groups of product ions generated for each of the mobility selection. The ionogram includes a first axis representing compensation voltage value and another axis representing intensity. A product ion peak is identified in the ionogram. At least one peak characteristic is identified of the product ion peak. A charge state of a precursor ion that was fragmented to form the product ions represented in the product ion peak is determined based on the at least one peak characteristic of the produce ion peak.
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公开(公告)号：US20230298876A1
公开(公告)日：2023-09-21
申请号：US18040779
申请日：2021-08-06
Applicant: DH TECHNOLOGIES DEVELOPMENT PTE. LTD.
Inventor： Nic BLOOMFIELD , Gordana IVOSEV , Pavel RYUMIN
CPC classification number: H01J49/0036 , H01J49/025
Abstract: Devices and methods are described for assigning charge state to detected ions from a mass analysis instrument. In one of the methods, the charge state may be assigned, for instance, by evaluation a detector response signal including information related to individual ion responses generated by an ion detector for each ion arrival event captured by the detector. The detector response signal may then be evaluated in combination with one or more additional features corresponding to the ion arrival event to assign a charge state for that ion arrival event.
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公开(公告)号：US20240404807A1
公开(公告)日：2024-12-05
申请号：US18694178
申请日：2022-09-23
Applicant: DH Technologies Development Pte. Ltd.
Inventor： Gordana IVOSEV , Chang LIU
Abstract: A method for determining a convolved peak intensity in a sample trace includes ejecting a plurality of sample ejections from a sample well plate. An ejection time log is generated which includes an ejection time of each of the plurality of sample ejections from the sample well plate. The plurality of sample ejections is analyzed with a mass analyzer. The sample trace of intensity versus time values is produced for the plurality of sample ejections based on the analysis. A known peak shape is obtained. A convolved peak intensity is determined for a convolved peak of the sample trace based at least in part on the known peak shape and the ejection time log.
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公开(公告)号：US20240395522A1
公开(公告)日：2024-11-28
申请号：US18693311
申请日：2022-09-19
Applicant: DH Technologies Development Pte. Ltd.
Inventor： Gordana IVOSEV , Chang LIU , Stephen TATE , Hui ZHANG
IPC: H01J49/00
Abstract: A method for performing mass spectrometry (MS) comprises receiving MS data corresponding to a plurality of MS runs, wherein MS data corresponding to an MS run of the plurality of MS runs comprises detected intensities for a plurality of mass over charge ratios (MZ values) during the MS run; finding a recurrent MZ value of the plurality of MZ values, wherein a detected intensity for the recurrent MZ value appears as a recurrent peak in MS data corresponding to a subset of the plurality of MS runs; and the subset of the plurality of MS runs includes at least two MS runs of the plurality of MS runs; and identifying the recurrent MZ value as corresponding to a background ion.
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