公开(公告)号：US20210366701A1

公开(公告)日：2021-11-25

申请号：US16980956

申请日：2019-04-10

Applicant: DH Technologies Development Pte. Ltd.

Inventor： Nic BLOOMFIELD ,  Igor CHERNUSHEVICH ,  Robert HAUFLER

IPC: H01J49/40 ,  H01J49/00 ,  H01J49/06 ,  H01J49/42

Abstract: Systems and methods are disclosed for dynamically switching an ion guide and a TOF mass analyzer between concentrating or not concentrating ions in a targeted acquisition. Product ions are ejected from the ion guide into the TOF mass analyzer and the intensity of a known product ion is measured at two or more time steps. The ion guide initially ejects product ions using a sequential or Zeno pulsing mode that concentrates product ions with different m/z values within the TOF mass analyzer at the same time. If the intensity of the product ion is increasing and greater than a threshold intensity, the ion guide switches to a continuous or normal pulsing mode that does not concentrate ions with different m/z values in the TOF mass analyzer at the same time. Similarly, if the intensity decreases below a threshold in continuous mode, the ion guide switches back to sequential mode.

公开(公告)号：US20240312776A1

公开(公告)日：2024-09-19

申请号：US18681206

申请日：2022-08-03

Applicant: DH Technologies Development Pte. Ltd.

Inventor： Pavel RYUMIN ,  Nichols G. BLOOMFIELD ,  Igor CHERNUSHEVICH

IPC: H01J49/42 ,  H01J49/00 ,  H01J49/40

CPC classification number: H01J49/4265 ,  H01J49/0031 ,  H01J49/40 ,  H01J49/4215

Abstract: A mass spectrometer that includes a mass filter and a TOF mass analyzer receives the ion beam from an ion source device that ionizes a compound of a sample. The mass filter selects a precursor ion mass range and the mass analyzer mass analyzes the mass range. A continuous flow of selected precursor ions is maintained between the mass filter and the mass analyzer. A first set of parameters is applied to the mass spectrometer to produce a resolution above a first resolution threshold. A space charge effect is detected by determining if the measured TIC exceeds a TIC threshold or the measured resolution is less than the first resolution threshold. If a space charge effect is detected, at least one precursor ion transmission window with a width smaller than the mass range is applied to the ion beam by the mass filter and mass analyzed to reduce the space charge.