摘要:
An apparatus for use in a radiation procedure includes a radiation filter having a first portion and a second portion, the first and the second portions forming a layer for filtering radiation impinging thereon, wherein the first portion is made from a first material having a first x-ray filtering characteristic, and the second portion is made from a second material having a second x-ray filtering characteristic. An apparatus for use in a radiation procedure includes a first target material, a second target material, and an accelerator for accelerating particles towards the first target material and the second target material to generate x-rays at a first energy level and a second energy level, respectively.
摘要:
A radiation detector includes a conversion element that converts an incoming radiation beam into electrical signals, which in turn can be used to generate data about the radiation beam. The conversion element may include, for example, a scintillator that converts the radiation beam into light, and a sensor that generates the signals in response to the light. The conversion element can be used in different schemes or data collection modes. For instance, the conversion element can be oriented normal to the radiation beam or transverse to the radiation beam. In either of these orientations, for example, the detector can be used in an integrating mode or in a counting mode.
摘要:
The claimed subject matter describes a novel technique to measure the beam profile using an area detector. In one embodiment, a set of one-dimensional beam profile measurements is performed by taking two images under the same source conditions but at two different positions of the detector, with each position of the detector shifted by a certain distance in the direction corresponding to the direction of the one-dimensional profile measurement. In further embodiments, a set of two-dimensional beam profile measurements is achieved by determining a second set of one-dimensional profiles from the same sampling points in a second direction and building a two-dimensional map of the beam profile by correlating the first one-dimensional profile measurement with the second one-dimensional profile measurement.