ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, PATTERN FORMING METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE

    公开(公告)号:US20240027908A1

    公开(公告)日:2024-01-25

    申请号:US18476975

    申请日:2023-09-28

    CPC classification number: G03F7/039 G03F7/038 G03F7/0045 C08F212/24 C08F212/30

    Abstract: An object of the present invention is to provide an actinic ray-sensitive or radiation-sensitive resin composition with which a pattern having excellent LWR and excellent resolution can be obtained, a resist film, a pattern forming method, and a method for manufacturing an electronic device. The actinic ray-sensitive or radiation-sensitive resin composition of the present invention is an actinic ray-sensitive or radiation-sensitive resin composition containing a resin A including a repeating unit a represented by Formula (1), which has a photoacid generating group represented by Formula (c) in a side chain, and a repeating unit b having a group which is decomposed by action of acid to generate a polar group, in which a content of the repeating unit a is 0.40 to 1.50 mmol/g per a total solid content mass of the composition, the actinic ray-sensitive or radiation-sensitive resin composition further contains an acid diffusion control agent which is decomposed by irradiation with an actinic ray or a radiation to generate an acid having a pKa higher than a pKa of an acid generated from the photoacid generating group by 0.50 or more, and Qp obtained by Expression (d) is 0.40 to 1.00.

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