公开(公告)号：US20140118016A1

公开(公告)日：2014-05-01

申请号：US13665247

申请日：2012-10-31

Applicant: FORMFACTOR, INC.

Inventor： Keith J. Breinlinger ,  Kevin J. Hughes

IPC: G01R31/20

CPC classification number: G01R1/06705 ,  G01R1/06733 ,  G01R1/06738 ,  G01R1/07314 ,  G01R1/07357

Abstract: Elongated flexible probes can be disposed in holes of upper and lower guide plates of a probe card assembly. Each probe can include one or more spring mechanisms that exert normal forces against sidewalls of holes in one of the guide plates. The normal forces can result in frictional forces against the sidewalls that are substantially parallel to the sidewalls. The frictional forces can reduce or impede movement parallel to the sidewalls of the probes in the holes.

Abstract translation: 细长的柔性探针可以设置在探针卡组件的上导向板和下导板的孔中。 每个探针可以包括一个或多个弹簧机构，其在一个导板中的孔的侧壁施加法向力。 法向力可导致基本上平行于侧壁的侧壁的摩擦力。 摩擦力可以减小或妨碍平行于孔中的探针侧壁的运动。

公开(公告)号：US10006938B2

公开(公告)日：2018-06-26

申请号：US13732922

申请日：2013-01-02

Applicant: FormFactor, Inc.

Inventor： Keith J. Breinlinger ,  Kevin J. Hughes ,  Russell Newstrom

IPC: G01R1/067 ,  G01R1/073

CPC classification number: G01R1/06705 ,  G01R1/0675 ,  G01R1/07314 ,  G01R1/07357

Abstract: The elongated body of an electrically conductive contact probe can be disposed in a guide hole and can include a patterned region for engaging and riding on a contact region of an inner sidewall of the guide hole as the elongated body moves in the guide hole in response to a force on a tip of the probe. As the patterned region rides the contact region, the tip moves in a lateral pattern that is a function of the surface(s) of the patterned region.

公开(公告)号：US10359447B2

公开(公告)日：2019-07-23

申请号：US13665247

申请日：2012-10-31

Applicant: FormFactor, Inc.

Inventor： Keith J. Breinlinger ,  Kevin J. Hughes

IPC: G01R31/20 ,  G01R1/067 ,  G01R1/073

Abstract: Elongated flexible probes can be disposed in holes of upper and lower guide plates of a probe card assembly. Each probe can include one or more spring mechanisms that exert normal forces against sidewalls of holes in one of the guide plates. The normal forces can result in frictional forces against the sidewalls that are substantially parallel to the sidewalls. The frictional forces can reduce or impede movement parallel to the sidewalls of the probes in the holes.

公开(公告)号：US20130169301A1

公开(公告)日：2013-07-04

申请号：US13732922

申请日：2013-01-02

Applicant: FormFactor, Inc.

Inventor： Keith J. Breinlinger ,  Kevin J. Hughes ,  Russell Newstrom

IPC: G01R1/067

CPC classification number: G01R1/06705 ,  G01R1/0675 ,  G01R1/07314 ,  G01R1/07357

Abstract: The elongated body of an electrically conductive contact probe can be disposed in a guide hole and can include a patterned region for engaging and riding on a contact region of an inner sidewall of the guide hole as the elongated body moves in the guide hole in response to a force on a tip of the probe. As the patterned region rides the contact region, the tip moves in a lateral pattern that is a function of the surface(s) of the patterned region.

Abstract translation: 导电接触探针的细长体可以设置在引导孔中，并且可以包括图案化区域，用于当细长体在引导孔中移动时接合和骑在引导孔的内侧壁的接触区域上，以响应于 探针尖端的力。 当图案区域绕着接触区域时，尖端以横向图案移动，该横向图案是图案化区域的表面的函数。