STRUCTURE AND METHOD OF CANCELLING TSV-INDUCED SUBSTRATE STRESS
    1.
    发明申请
    STRUCTURE AND METHOD OF CANCELLING TSV-INDUCED SUBSTRATE STRESS 审中-公开
    取消TSV诱导的基底应力的结构和方法

    公开(公告)号:US20150228555A1

    公开(公告)日:2015-08-13

    申请号:US14176178

    申请日:2014-02-10

    Abstract: Structures and methods of fabrication are provided with reduced or cancelled stress within the substrate of the structure adjacent to a through-substrate via. The fabrication method(s) includes: forming a structure with a through-substrate via (TSV) having a reduced device keep-out zone (KOZ) adjacent to the through-substrate via, the forming including: providing the through-substrate via within a substrate of the structure; and providing a stress-offset layer above the substrate selected and configured to provide a desired offset stress to reduce stress within the substrate caused by the presence of the through-substrate via within the substrate. In one embodiment, the stress-offset layer provides a desired compressive stress sufficient to reduce or eliminate tensile stress within the substrate due to the presence of the through-substrate via within the substrate.

    Abstract translation: 提供了结构和制造方法,其在邻近通过基板通孔的结构的衬底内具有减小或消除的应力。 制造方法包括:通过具有与贯穿基板通孔相邻的减小的器件保持区(KOZ)的通孔(TSV)形成结构,所述形成包括:通过内部提供贯穿衬底 该结构的基底; 以及在所述衬底之上提供应力偏移层,所述应力偏移层被选择并且被配置为提供期望的偏移应力,以减少由所述衬底内存在所述衬底所引起的衬底内的应力。 在一个实施例中,应力偏移层提供足以减少或消除基板内的拉应力的期望的压缩应力,这是由于在基板内存在贯穿基板。

Patent Agency Ranking