Multi-layer spacer used in finFET
    1.
    发明授权
    Multi-layer spacer used in finFET 有权
    用于finFET的多层间隔物

    公开(公告)号:US09419101B1

    公开(公告)日:2016-08-16

    申请号:US14932394

    申请日:2015-11-04

    Abstract: A method of forming spacers and the resulting fin-shaped field effect transistors are provided. Embodiments include forming a silicon (Si) fin over a substrate; forming a polysilicon gate over the Si fin; and forming a spacer on top and side surfaces of the polysilicon gate, and on exposed upper and side surfaces of the Si fin, the spacer including: a first layer and second layer having a first dielectric constant, and a third layer formed between the first and second layers and having a second dielectric constant, wherein the second dielectric constant is lower than the first dielectric constant.

    Abstract translation: 提供了形成间隔物的方法和所得的鳍状场效应晶体管。 实施例包括在衬底上形成硅(Si)鳍; 在Si鳍上形成多晶硅栅极; 以及在所述多晶硅栅极的顶表面和侧表面上形成间隔物,并且在所述Si鳍的暴露的上表面和外表面上,所述间隔物包括:具有第一介电常数的第一层和第二层,以及形成在所述第一 和第二层并具有第二介电常数,其中第二介电常数低于第一介电常数。

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