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公开(公告)号:US20250054908A1
公开(公告)日:2025-02-13
申请号:US18232876
申请日:2023-08-11
Applicant: GlobalFoundries U.S. Inc.
Inventor: Brett Cucci , Ramsey Hazbun , Richard Rassel , Zhong-Xiang He , Patrick Mitchell
IPC: H01L25/065 , H01L21/768 , H01L23/48
Abstract: Structures including a compound semiconductor layer stack and methods of forming such structures. The structure comprises a device region on a substrate. The device region includes a first section of a layer stack that has a plurality of semiconductor layers, and each semiconductor layer comprises a compound semiconductor material. The structure further comprises an isolation structure disposed about the section of the layer stack, and a device in the device region. The isolation structure penetrates through the layer stack to the substrate.
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2.
公开(公告)号:US20220357530A1
公开(公告)日:2022-11-10
申请号:US17313472
申请日:2021-05-06
Applicant: GLOBALFOUNDRIES U.S. Inc.
Inventor: Brett Cucci , Yusheng Bian , Abdelsalam Aboketaf , Edward Kiewra , Robert K. Leidy
IPC: G02B6/42
Abstract: Structures for an edge coupler of a photonics chip and methods of forming an edge coupler for a photonics chip. The structure includes a waveguide core on a dielectric layer, as well as an interconnect structure including a interlayer dielectric layer positioned over the dielectric layer and an opening penetrating through the interlayer dielectric layer to the waveguide core. A region of the interlayer dielectric layer is positioned to overlap with a portion of the waveguide core. The region of the interlayer dielectric layer has a surface that is rounded with a curvature.
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3.
公开(公告)号:US11774686B2
公开(公告)日:2023-10-03
申请号:US17313472
申请日:2021-05-06
Applicant: GLOBALFOUNDRIES U.S. Inc.
Inventor: Brett Cucci , Yusheng Bian , Abdelsalam Aboketaf , Edward Kiewra , Robert K. Leidy
IPC: G02B6/42
CPC classification number: G02B6/4206
Abstract: Structures for an edge coupler of a photonics chip and methods of forming an edge coupler for a photonics chip. The structure includes a waveguide core on a dielectric layer, as well as an interconnect structure including a interlayer dielectric layer positioned over the dielectric layer and an opening penetrating through the interlayer dielectric layer to the waveguide core. A region of the interlayer dielectric layer is positioned to overlap with a portion of the waveguide core. The region of the interlayer dielectric layer has a surface that is rounded with a curvature.
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公开(公告)号:US11520113B1
公开(公告)日:2022-12-06
申请号:US17356898
申请日:2021-06-24
Applicant: GLOBALFOUNDRIES U.S. Inc.
Inventor: Abdelsalam Aboketaf , Yusheng Bian , Edward Kiewra , Brett Cucci
IPC: G02B6/42 , H01L31/0232 , H01L31/0203 , G02B6/136
Abstract: Structures for a photodetector or terminator and methods of fabricating a structure for a photodetector or terminator. The structure includes a waveguide core, a light-absorbing layer having a sidewall, and a taper positioned adjacent to the sidewall of the light-absorbing layer. The taper extends laterally from the sidewall of the light-absorbing layer to overlap with the waveguide core, and the taper has a thickness that varies with position relative to the sidewall of the light-absorbing layer. For example, the thickness of the taper may decrease with increasing distance from the sidewall of the light-absorbing layer.
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