公开(公告)号：US07315997B2

公开(公告)日：2008-01-01

申请号：US10846517

申请日：2004-05-17

申请人： Hitoshi Watanabe ,  Hideaki Konishi ,  Yuko Katoh ,  Kazuyuki Yamamura ,  Naoko Karasawa ,  Takeshi Doi ,  Osamu Ōkano ,  Junko Kumagai ,  Koichi Itaya ,  Daisuke Tsukuda ,  Ryuji Shimizu ,  Toshihito Shimizu

发明人： Hitoshi Watanabe ,  Hideaki Konishi ,  Yuko Katoh ,  Kazuyuki Yamamura ,  Naoko Karasawa ,  Takeshi Doi ,  Osamu Ōkano ,  Junko Kumagai ,  Koichi Itaya ,  Daisuke Tsukuda ,  Ryuji Shimizu ,  Toshihito Shimizu

IPC分类号： G06F17/50

CPC分类号： G06F17/5045 ,  G01R31/31724 ,  G01R31/318555 ,  H01L2924/0002 ,  H01L2924/00

摘要： A design support apparatus includes a unit that inputs a user net list created by using hard macro cells excluding test circuits, and a unit that arranges hard macro cells using a frame into which hard macro cells, where timing-converged physical information includes test terminals, and test circuits are embedded as arrangement/wiring information. Moreover, includes a unit that arranges and wires the test circuits using the arrangement/wiring information of the test circuit embedded into the frame, a unit that recognizes arrangement/wiring information where the arrangement/wiring information of the test circuits is removed from arrangement/wiring information obtained by wiring, and a unit outputs a net list of a logic structure.

摘要翻译： 设计支持装置包括：输入通过使用除了测试电路之外的硬宏小区创建的用户网络列表的单元，以及使用硬宏小区来排列硬宏小区的单元，硬宏小区（其中定时收敛的物理信息包括测试终端） 并且测试电路被嵌入作为布置/布线信息。 此外，包括使用嵌入到框架中的测试电路的布置/布线信息来布置和布线测试电路的单元，识别布置/布线信息的单元，其中测试电路的布置/布线信息从布置/ 通过布线获得的布线信息，单元输出逻辑结构的网表。

公开(公告)号：US20050172254A1

公开(公告)日：2005-08-04

申请号：US10846517

申请日：2004-05-17

申请人： Hitoshi Watanabe ,  Hideaki Konishi ,  Yuko Katoh ,  Kazuyuki Yamamura ,  Naoko Karasawa ,  Takeshi Doi ,  Osamu Okano ,  Junko Kumagai ,  Koichi Itaya ,  Daisuke Tsukuda ,  Ryuji Shimizu ,  Toshihito Shimizu

发明人： Hitoshi Watanabe ,  Hideaki Konishi ,  Yuko Katoh ,  Kazuyuki Yamamura ,  Naoko Karasawa ,  Takeshi Doi ,  Osamu Okano ,  Junko Kumagai ,  Koichi Itaya ,  Daisuke Tsukuda ,  Ryuji Shimizu ,  Toshihito Shimizu

IPC分类号： G06F17/50 ,  G01R31/28 ,  G01R31/317 ,  G01R31/3185 ,  H01L21/82

CPC分类号： G06F17/5045 ,  G01R31/31724 ,  G01R31/318555 ,  H01L2924/0002 ,  H01L2924/00

摘要： A design support apparatus includes a unit that inputs a user net list created by using hard macro cells excluding test circuits, and a unit that arranges hard macro cells using a frame into which hard macro cells, where timing-converged physical information includes test terminals, and test circuits are embedded as arrangement/wiring information. Moreover, includes a unit that arranges and wires the test circuits using the arrangement/wiring information of the test circuit embedded into the frame, a unit that recognizes arrangement/wiring information where the arrangement/wiring information of the test circuits is removed from arrangement/wiring information obtained by wiring, and a unit outputs a net list of a logic structure.

摘要翻译： 设计支持装置包括：输入通过使用除了测试电路之外的硬宏小区创建的用户网络列表的单元，以及使用硬宏小区来排列硬宏小区的单元，硬宏小区（其中定时收敛的物理信息包括测试终端） 并且测试电路被嵌入作为布置/布线信息。 此外，包括使用嵌入到框架中的测试电路的布置/布线信息来布置和布线测试电路的单元，识别布置/布线信息的单元，其中测试电路的布置/布线信息从布置/ 通过布线获得的布线信息，单元输出逻辑结构的网表。

公开(公告)号：US08127191B2

公开(公告)日：2012-02-28

申请号：US12643874

申请日：2009-12-21

申请人： Takashi Maki ,  Daisuke Tsukuda ,  Tetsuya Hiramatsu

发明人： Takashi Maki ,  Daisuke Tsukuda ,  Tetsuya Hiramatsu

IPC分类号： G01R31/28 ,  G01R31/3187 ,  G01R27/28 ,  G01R31/00 ,  G01R31/14 ,  G11C7/00 ,  G11C29/00 ,  G11C7/02

CPC分类号： G11C29/14 ,  G11C29/12015 ,  G11C2029/0405

摘要： A semiconductor integrated circuit includes a self-test circuit, wherein, when a operation mode of the self-test circuit has been switched from a low-speed operation mode to a high-speed operation mode, processing is performed in the high-speed operation mode during a given time period, and the processing result is invalidated based on a control signal.

摘要翻译： 半导体集成电路包括自检电路，其中当自检电路的操作模式从低速操作模式切换到高速操作模式时，在高速操作中执行处理 模式，并且处理结果基于控制信号无效。

公开(公告)号：US20100218057A1

公开(公告)日：2010-08-26

申请号：US12643874

申请日：2009-12-21

申请人： Takashi MAKI ,  Daisuke Tsukuda ,  Tetsuya Hiramatsu

发明人： Takashi MAKI ,  Daisuke Tsukuda ,  Tetsuya Hiramatsu

IPC分类号： G11C29/12 ,  G06F11/27

CPC分类号： G11C29/14 ,  G11C29/12015 ,  G11C2029/0405

摘要： A semiconductor integrated circuit includes a self-test circuit, wherein, when a operation mode of the self-test circuit has been switched from a low-speed operation mode to a high-speed operation mode, processing is performed in the high-speed operation mode during a given time period, and the processing result is invalidated based on a control signal.

摘要翻译： 半导体集成电路包括自检电路，其中当自检电路的操作模式从低速操作模式切换到高速操作模式时，在高速操作中执行处理 模式，并且处理结果基于控制信号无效。

公开(公告)号：US09513477B2

公开(公告)日：2016-12-06

申请号：US13814410

申请日：2011-07-19

申请人： Genichiro Sato ,  Masatoshi Azuma ,  Daisuke Tsukuda ,  Masao Itagaki

发明人： Genichiro Sato ,  Masatoshi Azuma ,  Daisuke Tsukuda ,  Masao Itagaki

IPC分类号： G02B27/01 ,  G02B5/02

CPC分类号： G02B27/0101 ,  G02B5/02 ,  G02B2027/0118

摘要： Provided is a vehicular heads-up display device with which it is possible to avoid burn-in of an internal component upon a reflecting member by exterior light, improving display quality. A vehicular heads-up display device, comprising a case body (50) whereon an aperture part (51c) is disposed and a light-emitting body (30) that is housed within the case body (50) reflects emitted light L that is emitted by the light-emitting body (30) externally to the case body (50) via the aperture part (51c) and reflects said emitted light L from the windshield (13), causing the driver (14) to have sight of the virtual image V that is obtained by said reflection. The vehicular heads-up display device further comprises a semi-transmissible cover (55) installed in the aperture part (51c), and a dispersal means (58) is disposed between the light emitting body (30) and the cover (55), for dispersing exterior light that enters the case body (50) via the cover (55).

摘要翻译： 本发明提供一种车辆平视显示装置，能够通过外部光来避免反射部件内部部件的老化，提高显示质量。 一种车载平视显示装置，包括其中设置开口部分（51c）的壳体（50）和容纳在壳体（50）内的发光体（30）反射发射的发射光L 通过所述开口部（51c）从所述壳体（50）的外部通过所述发光体（30）反射来自所述挡风玻璃（13）的所述发射光L，使得所述驱动器（14）看到所述虚像 V，由所述反射获得。 所述车辆平视显示装置还包括安装在所述开口部分（51c）中的半透明盖（55），并且在所述发光体（30）和所述盖（55）之间设置有分散装置（58） 用于通过盖（55）分散进入壳体（50）的外部光。

公开(公告)号：US20130135748A1

公开(公告)日：2013-05-30

申请号：US13814410

申请日：2011-07-19

申请人： Genichiro Sato ,  Masatoshi Azuma ,  Daisuke Tsukuda ,  Masao Itagaki

发明人： Genichiro Sato ,  Masatoshi Azuma ,  Daisuke Tsukuda ,  Masao Itagaki

IPC分类号： G02B27/01

CPC分类号： G02B27/0101 ,  G02B5/02 ,  G02B2027/0118

摘要： Provided is a vehicular heads-up display device with which it is possible to avoid burn-in of an internal component upon a reflecting member by exterior light, improving display quality. A vehicular heads-up display device, comprising a case body (50) whereon an aperture part (51c) is disposed and a light-emitting body (30) that is housed within the case body (50) reflects emitted light L that is emitted by the light-emitting body (30) externally to the case body (50) via the aperture part (51c) and reflects said emitted light L from the windshield (13), causing the driver (14) to have sight of the virtual image V that is obtained by said reflection. The vehicular heads-up display device further comprises a semi-transmissible cover (55) installed in the aperture part (51c), and a dispersal means (58) is disposed between the light emitting body (30) and the cover (55), for dispersing exterior light that enters the case body (50) via the cover (55).

摘要翻译： 本发明提供一种车辆平视显示装置，能够通过外部光来避免反射部件内部部件的老化，提高显示质量。 一种车载平视显示装置，包括其中设置开口部分（51c）的壳体（50）和容纳在壳体（50）内的发光体（30）反射发射的发射光L 通过所述开口部（51c）从所述壳体（50）的外部通过所述发光体（30）反射来自所述挡风玻璃（13）的所述发射光L，使得所述驱动器（14）看到所述虚像 V，由所述反射获得。 所述车辆平视显示装置还包括安装在所述开口部分（51c）中的半透明盖（55），并且在所述发光体（30）和所述盖（55）之间设置有分散装置（58） 用于通过盖（55）分散进入壳体（50）的外部光。