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公开(公告)号：US20160034338A1
公开(公告)日：2016-02-04
申请号：US14878985
申请日：2015-10-08
Applicant: INTEL CORPORATION
Inventor： Keith A. Bowman , James W. Tschanz , Nam Sung Kim , Janice C. Lee , Christopher B. Wilkerson , Shih-Lien L. Lu , Tanay Karnik , Vivek K. De
IPC: G06F11/07
CPC classification number: G01R31/3177 , G01R31/31723 , G01R31/31725 , G01R31/31727 , G06F1/10 , G06F11/0706 , G06F11/0757 , G06F11/0793 , H03K3/0375
Abstract: Sequential circuits with error-detection are provided. They may, for example, be used to replace traditional master-slave flip-flops, e.g., in critical path circuits to detect and initiate correction of late transitions at the input of the sequential. In some embodiments, such sequentials may comprise a transition detector with a time borrowing latch.
Abstract translation: 提供了具有错误检测的顺序电路。 例如，它们可以用于替代传统的主从触发器，例如在关键路径电路中，以检测并启动在顺序输入处的后期转换的校正。 在一些实施例中，这样的顺序可以包括具有时间借用锁存器的转换检测器。
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公开(公告)号：US10024916B2
公开(公告)日：2018-07-17
申请号：US15422392
申请日：2017-02-01
Applicant: INTEL CORPORATION
Inventor： Keith A. Bowman , James W. Tschanz , Nam Sung Kim , Janice C. Lee , Christopher B. Wilkerson , Shih-Lien L. Lu , Tanay Karnik , Vivek K. De
IPC: G01R31/3177 , G01R31/317
Abstract: Sequential circuits with error-detection are provided. They may, for example, be used to replace traditional master-slave flip-flops, e.g., in critical path circuits to detect and initiate correction of late transitions at the input of the sequential. In some embodiments, such sequentials may comprise a transition detector with a time borrowing latch.
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公开(公告)号：US20170139006A1
公开(公告)日：2017-05-18
申请号：US15422392
申请日：2017-02-01
Applicant: INTEL CORPORATION
Inventor： Keith A. Bowman , James W. Tschanz , Nam Sung Kim , Janice C. Lee , Christopher B. Wilkerson , Shih-Lien L. Lu , Tanay Karnik , Vivek K. De
IPC: G01R31/3177 , G01R31/317
CPC classification number: G01R31/3177 , G01R31/31723 , G01R31/31725 , G01R31/31727 , G06F1/10 , G06F11/0706 , G06F11/0757 , G06F11/0793 , H03K3/0375
Abstract: Sequential circuits with error-detection are provided. They may, for example, be used to replace traditional master-slave flip-flops, e.g., in critical path circuits to detect and initiate correction of late transitions at the input of the sequential. In some embodiments, such sequentials may comprise a transition detector with a time borrowing latch.
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公开(公告)号：US09594625B2
公开(公告)日：2017-03-14
申请号：US14878985
申请日：2015-10-08
Applicant: INTEL CORPORATION
Inventor： Keith A. Bowman , James W. Tschanz , Nam Sung Kim , Janice C. Lee , Christopher B. Wilkerson , Shih-Lien L. Lu , Tanay Karnik , Vivek K. De
IPC: G06F11/07 , G06F1/10 , H03K3/037 , G01R31/317
CPC classification number: G01R31/3177 , G01R31/31723 , G01R31/31725 , G01R31/31727 , G06F1/10 , G06F11/0706 , G06F11/0757 , G06F11/0793 , H03K3/0375
Abstract: Sequential circuits with error-detection are provided. They may, for example, be used to replace traditional master-slave flip-flops, e.g., in critical path circuits to detect and initiate correction of late transitions at the input of the sequential. In some embodiments, such sequentials may comprise a transition detector with a time borrowing latch.
Abstract translation: 提供了具有错误检测的顺序电路。 例如，它们可以用于替代传统的主从触发器，例如在关键路径电路中，以检测并启动在顺序输入处的后期转换的校正。 在一些实施例中，这样的顺序可以包括具有时间借用锁存器的转换检测器。
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