Digitally controlled zero current switching

    公开(公告)号:US09819266B2

    公开(公告)日:2017-11-14

    申请号:US14757732

    申请日:2015-12-23

    CPC classification number: H02M3/158 H02M1/083 H02M3/1588 Y02B70/1466

    Abstract: Generally, this disclosure describes an apparatus. The apparatus includes switch controller circuitry and zero crossing logic circuitry. The switch controller circuitry is to control a conduction state of a high side switch and a low side switch in a DC to DC converter. The zero crossing logic circuitry includes phase comparator circuitry, a first clocking circuitry and a second clocking circuitry. Each clocking circuitry includes one or more delay elements. The zero crossing logic circuitry is to monitor a switch node voltage, Vsw, and to determine whether Vsw is greater than a reference, Vref. The switch controller circuitry is to turn off a low side switch if Vsw is greater than Vref while the low side switch is turned on, Vsw greater than Vref corresponding to a negative inductor current.

    Apparatus and method for detecting or repairing minimum delay errors
    3.
    发明授权
    Apparatus and method for detecting or repairing minimum delay errors 有权
    用于检测或修复最小延迟误差的装置和方法

    公开(公告)号:US09520877B2

    公开(公告)日:2016-12-13

    申请号:US14572031

    申请日:2014-12-16

    CPC classification number: H03K19/00323 H03K5/26

    Abstract: Described are apparatuses and methods for detecting or repairing minimum-delay errors. The apparatus may include a minimum-delay error detector (MDED) to receive a clock signal and a data path signal and to detect a minimum-delay error (MDE) in the data path based on the received data path signal and the clock signal. The MDE may be repaired by adjusting one or more regional clock buffers coupled to the MDED. Further, the apparatus may include minimum-delay path replicas (MDPRs) used for detecting and repairing MDEs during normal system operations. Other embodiments may be described and/or claimed.

    Abstract translation: 描述了用于检测或修复最小延迟误差的装置和方法。 该装置可以包括用于接收时钟信号和数据路径信号的最小延迟误差检测器(MDED),并且基于所接收的数据路径信号和时钟信号来检测数据路径中的最小延迟误差(MDE)。 可以通过调整耦合到MDED的一个或多个区域时钟缓冲器来修复MDE。 此外,该装置可以包括用于在正常系统操作期间检测和修复MDE的最小延迟路径副本(MDPR)。 可以描述和/或要求保护其他实施例。

    Aging aware dynamic keeper apparatus and associated method

    公开(公告)号:US10269419B2

    公开(公告)日:2019-04-23

    申请号:US15604519

    申请日:2017-05-24

    Abstract: Described is an apparatus which comprises: a memory bit-cell; a local bit-line (LBL) coupled to the memory bit-cell via a read port device; a NAND gate circuitry coupled to the LBL; and a stack of keepers coupled to the LBL, wherein at least one transistor of the stack of keepers is controllable according to an output of the NAND gate circuitry, wherein the stack of keepers includes transistors with variable strength which are to be turned on overtime.

    AGING AWARE DYNAMIC KEEPER APPARATUS AND ASSOCIATED METHOD

    公开(公告)号:US20180342289A1

    公开(公告)日:2018-11-29

    申请号:US15604519

    申请日:2017-05-24

    CPC classification number: G11C11/419

    Abstract: Described is an apparatus which comprises: a memory bit-cell; a local bit-line (LBL) coupled to the memory bit-cell via a read port device; a NAND gate circuitry coupled to the LBL; and a stack of keepers coupled to the LBL, wherein at least one transistor of the stack of keepers is controllable according to an output of the NAND gate circuitry, wherein the stack of keepers includes transistors with variable strength which are to be turned on overtime.

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