Methods of manufacturing semiconductor devices
    1.
    发明授权
    Methods of manufacturing semiconductor devices 有权
    制造半导体器件的方法

    公开(公告)号:US08435877B2

    公开(公告)日:2013-05-07

    申请号:US13227799

    申请日:2011-09-08

    IPC分类号: H01L21/28

    摘要: A semiconductor device includes gate structures including a tunnel insulating layer pattern, a floating gate, a dielectric layer pattern and a control gate sequentially disposed on a substrate. The control gate includes an impurity doped polysilicon layer pattern and a metal layer pattern. The gate structures are spaced apart from each other on the substrate. A capping layer pattern is disposed on a sidewall portion of the metal layer pattern and includes a metal oxide. An insulating layer covers the gate structures and the capping layer pattern. The insulating layer is formed on the substrate and includes an air-gap therein.

    摘要翻译: 半导体器件包括栅极结构,其包括顺序地设置在衬底上的隧道绝缘层图案,浮动栅极,电介质层图案和控制栅极。 控制栅极包括杂质掺杂多晶硅层图案和金属层图案。 栅极结构在衬底上彼此间隔开。 覆盖层图案设置在金属层图案的侧壁部分上并且包括金属氧化物。 绝缘层覆盖栅极结构和覆盖层图案。 绝缘层形成在基板上并且在其中包括气隙。

    METHODS OF MANUFACTURING SEMICONDUCTOR DEVICES
    2.
    发明申请
    METHODS OF MANUFACTURING SEMICONDUCTOR DEVICES 有权
    制造半导体器件的方法

    公开(公告)号:US20120064707A1

    公开(公告)日:2012-03-15

    申请号:US13227799

    申请日:2011-09-08

    IPC分类号: H01L21/28

    摘要: A semiconductor device includes gate structures including a tunnel insulating layer pattern, a floating gate, a dielectric layer pattern and a control gate sequentially disposed on a substrate. The control gate includes an impurity doped polysilicon layer pattern and a metal layer pattern. The gate structures are spaced apart from each other on the substrate. A capping layer pattern is disposed on a sidewall portion of the metal layer pattern and includes a metal oxide. An insulating layer covers the gate structures and the capping layer pattern. The insulating layer is formed on the substrate and includes an air-gap therein.

    摘要翻译: 半导体器件包括栅极结构,其包括顺序地设置在衬底上的隧道绝缘层图案,浮动栅极,电介质层图案和控制栅极。 控制栅极包括杂质掺杂多晶硅层图案和金属层图案。 栅极结构在衬底上彼此间隔开。 覆盖层图案设置在金属层图案的侧壁部分上并且包括金属氧化物。 绝缘层覆盖栅极结构和覆盖层图案。 绝缘层形成在基板上并且在其中包括气隙。

    Semiconductor devices including vertical channel pattern
    3.
    发明授权
    Semiconductor devices including vertical channel pattern 有权
    半导体器件包括垂直沟道图案

    公开(公告)号:US08637917B2

    公开(公告)日:2014-01-28

    申请号:US13208640

    申请日:2011-08-12

    IPC分类号: H01L27/105

    摘要: An insulating pattern is disposed on a surface of a semiconductor substrate and includes a silicon oxynitride film. A conductive pattern is disposed on the insulating pattern. A data storage pattern and a vertical channel pattern are disposed within a channel hole formed to vertically penetrate the insulating pattern and the conductive pattern. The data storage pattern and the vertical channel pattern are conformally stacked along sidewalls of the insulating pattern and the conductive pattern. A concave portion is formed in the semiconductor substrate adjacent to the insulating pattern. The concave portion is recessed relative to a bottom surface of the insulating pattern.

    摘要翻译: 绝缘图案设置在半导体衬底的表面上并且包括氮氧化硅膜。 导电图案设置在绝缘图案上。 数据存储图案和垂直沟道图案设置在垂直穿透绝缘图案和导电图案的通道孔内。 数据存储图案和垂直沟道图案沿着绝缘图案和导电图案的侧壁共形堆叠。 在与绝缘图案相邻的半导体衬底中形成凹部。 凹部相对于绝缘图案的底面凹陷。

    SEMICONDUCTOR DEVICES INCLUDING VERTICAL CHANNEL PATTERN
    4.
    发明申请
    SEMICONDUCTOR DEVICES INCLUDING VERTICAL CHANNEL PATTERN 有权
    包括垂直通道图案的半导体器件

    公开(公告)号:US20120037977A1

    公开(公告)日:2012-02-16

    申请号:US13208640

    申请日:2011-08-12

    IPC分类号: H01L27/105 H01L29/792

    摘要: An insulating pattern is disposed on a surface of a semiconductor substrate and includes a silicon oxynitride film. A conductive pattern is disposed on the insulating pattern. A data storage pattern and a vertical channel pattern are disposed within a channel hole formed to vertically penetrate the insulating pattern and the conductive pattern. The data storage pattern and the vertical channel pattern are conformally stacked along sidewalls of the insulating pattern and the conductive pattern. A concave portion is formed in the semiconductor substrate adjacent to the insulating pattern. The concave portion is recessed relative to a bottom surface of the insulating pattern.

    摘要翻译: 绝缘图案设置在半导体衬底的表面上并且包括氮氧化硅膜。 导电图案设置在绝缘图案上。 数据存储图案和垂直沟道图案设置在垂直穿透绝缘图案和导电图案的通道孔内。 数据存储图案和垂直沟道图案沿着绝缘图案和导电图案的侧壁共形堆叠。 在与绝缘图案相邻的半导体衬底中形成凹部。 凹部相对于绝缘图案的底面凹陷。