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公开(公告)号:US20190073251A1
公开(公告)日:2019-03-07
申请号:US16178963
申请日:2018-11-02
Applicant: MICRON TECHNOLOGY, INC.
Inventor: Michael G. Miller , Ashutosh Malshe , Violante Moschiano , Peter Feeley , Gary F. Besinga , Sampath K. Ratnam , Walter Di-Francesco , Renato C. Padilla, JR. , Yun Li , Kishore Kumar Muchherla
CPC classification number: G06F11/073 , G06F3/0619 , G06F3/0659 , G06F3/0679 , G06F11/0751 , G06F11/0772 , G06F11/079 , G06F11/1068 , G11C5/144 , G11C11/5628 , G11C16/10 , G11C16/225 , G11C16/30 , G11C16/3459
Abstract: Apparatus having an array of memory cells include a controller configured to read a particular memory cell of a last written page of memory cells of a block of memory cells of the array of memory cells, determine whether a threshold voltage of the particular memory cell is less than a particular voltage level, and mark the last written page of memory cells as affected by power loss during a programming operation of the last written page of memory cells when the threshold voltage of the particular memory cell is determined to be higher than the particular voltage level.
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公开(公告)号:US20180196705A1
公开(公告)日:2018-07-12
申请号:US15911490
申请日:2018-03-05
Applicant: MICRON TECHNOLOGY, INC.
Inventor: Michael G. Miller , Ashutosh Malshe , Violante Moschiano , Peter Feeley , Gary F. Besinga , Sampath K. Ratnam , Walter Di-Francesco , Renato C. Padilla, JR. , Yun Li , Kishore Kumar Muchherla
CPC classification number: G06F11/073 , G06F3/0619 , G06F3/0659 , G06F3/0679 , G06F11/0751 , G06F11/0772 , G06F11/079
Abstract: Apparatus include controllers configured to iteratively program a group of memory cells to respective desired data states; determine whether a power loss to the apparatus is indicated while iteratively programming the group of memory cells; and if a power loss to the apparatus is indicated, to change the desired data state of the particular memory cell before continuing with the programming. Apparatus further include controllers configured to read a particular memory cell of a last written page of memory cells, determine whether a threshold voltage of the particular memory cell is less than a particular voltage level, and to mark the last written page of memory cells as affected by power loss during a programming operation of the last written page of memory cells when the threshold voltage of the particular memory cell is determined to be higher than the particular voltage level.
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