MEMORY CONTROLLERS INCLUDING TEST MODE ENGINES AND METHODS FOR REPAIR OF MEMORY OVER BUSSES USED DURING NORMAL OPERATION OF THE MEMORY
    2.
    发明申请
    MEMORY CONTROLLERS INCLUDING TEST MODE ENGINES AND METHODS FOR REPAIR OF MEMORY OVER BUSSES USED DURING NORMAL OPERATION OF THE MEMORY 审中-公开
    包含测试模式发动机的存储器控​​制器和用于在存储器的正常操作期间使用的总线上的存储器的修复方法

    公开(公告)号:US20140258780A1

    公开(公告)日:2014-09-11

    申请号:US13785668

    申请日:2013-03-05

    Inventor: Dean C. Eyres

    CPC classification number: G11C29/16 G11C29/4401 G11C2029/0409

    Abstract: Examples of memory controllers are described that may repair a memory using a bus between the memory controller and the memory. The memory controllers may include a test mode engine able to place the memory into a test mode of operation using a combination of signals over the bus, which combination of signals may be illegal in normal operation. The memory system controllers may include a BIST engine for testing the memory and obtaining information regarding memory fail information. The test mode engines may be configured to adjust a clock frequency during the test mode of operation, including stopping a clock signal in some examples between test mode commands.

    Abstract translation: 描述了可以使用存储器控制器和存储器之间的总线修复存储器的存储器控​​制器的示例。 存储器控制器可以包括能够使用总线上的信号的组合将存储器置于测试操作模式的测试模式引擎,在正常操作中信号的组合可能是非法的。 存储器系统控制器可以包括用于测试存储器并获得关于存储器故障信息的信息的BIST引擎。 测试模式引擎可以被配置为在测试操作模式期间调整时钟频率,包括在测试模式命令之间的一些示例中停止时钟信号。

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