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公开(公告)号:US20240215246A1
公开(公告)日:2024-06-27
申请号:US18596580
申请日:2024-03-05
Applicant: Micron Technology, Inc.
Inventor: Swapnil A. Lengade , Jeremy Adams , Naiming Liu , Jeslin J. Wu , Kadir Abdul , Carlo Mendoza Orofeo
CPC classification number: H10B43/27 , H01L21/0217 , H01L21/02266 , H01L21/02274 , H10B41/27
Abstract: A method of forming a microelectronic device comprises forming a stack structure comprising a vertically alternating sequence of insulative structures and additional insulative structures, at least some of the additional insulative structures comprising silicon nitride having a ratio of nitrogen atoms to silicon atoms greater than about 1.58:1.00, forming openings through the stack structure, and forming cell pillar structures within the openings, the cell pillar structures individually comprising a semiconductor channel material vertically extending through the stack structure. Related methods, microelectronic devices, memory devices, and electronic systems are also described.
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公开(公告)号:US12004346B2
公开(公告)日:2024-06-04
申请号:US17200169
申请日:2021-03-12
Applicant: Micron Technology, Inc.
Inventor: Swapnil Lengade , Jeremy Adams , Naiming Liu , Jeslin J. Wu , Kadir Abdul , Carlo Mendoza Orofeo
CPC classification number: H10B43/27 , H01L21/0217 , H01L21/02266 , H01L21/02274 , H10B41/27
Abstract: A method of forming a microelectronic device comprises forming a stack structure comprising a vertically alternating sequence of insulative structures and additional insulative structures, at least some of the additional insulative structures comprising silicon nitride having a ratio of nitrogen atoms to silicon atoms greater than about 1.58:1.00, forming openings through the stack structure, and forming cell pillar structures within the openings, the cell pillar structures individually comprising a semiconductor channel material vertically extending through the stack structure. Related methods, microelectronic devices, memory devices, and electronic systems are also described.
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