公开(公告)号：US20220102076A1

公开(公告)日：2022-03-31

申请号：US17411147

申请日：2021-08-25

Applicant: Murata Manufacturing Co., Ltd.

Inventor： Shinya ISOTA ,  Takehisa SASABAYASHI ,  Kazuhisa UCHIDA ,  Hideyuki HASHIMOTO ,  Yuta OSHIMA

IPC: H01G4/30 ,  H01G4/012 ,  H01G4/12 ,  H01G4/008

Abstract: A multilayer ceramic capacitor includes a base body including first and second main surfaces, first and second side surfaces, first and second end surfaces, and dielectric layers and internal electrode layers, and external electrodes at the first and second end surfaces, and electrically connected to the internal electrode layers. The base body includes an inner layer, first and second outer layers, first and second side margin portions. The dielectric layers in the inner layer and the first and second outer layers include main crystal grains including barium and titanium, and with respect to 100 parts by mol of titanium, nickel in an amount of about 0.2 to about 3.0 parts by mol, and at least one rare earth element selected from yttrium, praseodymium, neodymium, samarium, europium, gadolinium, terbium, dysprosium, holmium, erbium, thulium, ytterbium, and lutetium in an amount of about 0.6 parts to about 2.0 parts by mol.

公开(公告)号：US20240274357A1

公开(公告)日：2024-08-15

申请号：US18608993

申请日：2024-03-19

Applicant: Murata Manufacturing Co., Ltd.

Inventor： Hideyuki HASHIMOTO ,  Takehisa SASABAYASHI

IPC: H01G4/12 ,  H01G4/008 ,  H01G4/012 ,  H01G4/30

CPC classification number: H01G4/1272 ,  H01G4/008 ,  H01G4/012 ,  H01G4/30

Abstract: A multilayer ceramic capacitor includes outer electrodes at first and second end surfaces and coupled to inner electrode layers. Dielectric ceramic layers include crystal grains including a perovskite oxide. When a cross-section of the dielectric ceramic layers is observed using a scanning transmission electron microscope, the dielectric ceramic layers include grains, on which a plane of a perovskite structure is observed, as crystal grains. When a thickness of the dielectric ceramic layers is denoted by d, at least a subset of the grains is provided in near-electrode regions located inside the dielectric ceramic layers and extending to a distance of about 0.1 d from interfaces with adjacent inner electrode layers.

公开(公告)号：US20240170220A1

公开(公告)日：2024-05-23

申请号：US18423457

申请日：2024-01-26

Applicant: Murata Manufacturing Co., Ltd.

Inventor： Shinya ISOTA ,  Hideyuki HASHIMOTO ,  Yuta OSHIMA

IPC: H01G4/30 ,  H01G4/008 ,  H01G4/012 ,  H01G4/12 ,  H01G4/232

CPC classification number: H01G4/30 ,  H01G4/008 ,  H01G4/012 ,  H01G4/232 ,  H01G4/12

Abstract: A multilayer ceramic capacitor includes a multilayer body including first and second main surfaces opposite to each other in a thickness direction, first and second side surfaces opposite to each other in a width direction, and first and second end surfaces opposite to each other in a length direction, the multilayer body including dielectric layers and inner electrode layers laminated in the thickness direction, and a pair of outer electrodes on the first and second end surfaces and connected to the inner electrode layers. The dielectric layers include dielectric particles. The multilayer body includes a layered first side portion, a layered second side portion, a first outer layer portion, a second outer layer portion, and an inner layer portion.

公开(公告)号：US20200312570A1

公开(公告)日：2020-10-01

申请号：US16824735

申请日：2020-03-20

Applicant: Murata Manufacturing Co., Ltd.

Inventor： Hideyuki HASHIMOTO

IPC: H01G4/30 ,  H01G4/012 ,  H01G4/232 ,  H01G4/248 ,  H01G4/12 ,  H01G4/008

Abstract: A multilayer ceramic capacitor includes a ceramic main body including dielectric layers and internal electrodes, principal surfaces, side surfaces, and end surfaces, and an external electrode electrically connected to the internal electrode on both end surfaces. The dielectric layer includes at least one element of Si and Mg. In a section defined by the width and lamination directions at a position of a central portion in the length direction of the ceramic main body, an outside in the width direction is higher than a central portion in the width direction in an amount of at least one element existing in a rectangular region of about 10 μm×about 10 μm of the dielectric layer in planar view, and continuity of the internal electrodes within a range of about 10 μm from an end in the width direction of the internal electrodes is greater than or equal to about 95%.

公开(公告)号：US20240222022A1

公开(公告)日：2024-07-04

申请号：US18608999

申请日：2024-03-19

Applicant: Murata Manufacturing Co., Ltd.

Inventor： Hideyuki HASHIMOTO ,  Takehisa SASABAYASHI

IPC: H01G4/12 ,  H01G4/224 ,  H01G4/30

CPC classification number: H01G4/1227 ,  H01G4/224 ,  H01G4/306

Abstract: A multilayer ceramic capacitor includes dielectric ceramic layers and inner electrode layers. The dielectric ceramic layers include crystal grains including a perovskite oxide including at least one A-site element and at least one B-site element. When a cross-section of the dielectric ceramic layers is observed using a scanning transmission electron microscope, the dielectric ceramic layers include grains, on which a plane of a perovskite structure is observed, as crystal grains. The grains, when subjected to compositional analysis by energy dispersive x-ray spectroscopy, have an atom-distributed region in which a concentration of the A-site element or B-site element (c) subtracted from a maximum concentration of the element (cmax) (Δc=cmax−c) is about 2 atm % or less, at one or more atomic sites in the grains, and an area of the atom-distributed region (SΔc≤2%) is about 0.050 nm2 or less.

公开(公告)号：US20240222021A1

公开(公告)日：2024-07-04

申请号：US18608996

申请日：2024-03-19

Applicant: Murata Manufacturing Co., Ltd.

Inventor： Hideyuki HASHIMOTO ,  Takehisa SASABAYASHI

IPC: H01G4/12 ,  H01G4/012 ,  H01G4/232 ,  H01G4/30

CPC classification number: H01G4/1227 ,  H01G4/30 ,  H01G4/012 ,  H01G4/2325

Abstract: A multilayer ceramic capacitor includes a body including dielectric ceramic layers and inner electrode layers. The dielectric ceramic layers include crystal grains including a perovskite oxide including at least one A-site element and at least one B-site element. When a cross-section of the dielectric ceramic layers is observed using a scanning transmission electron microscope, the dielectric ceramic layers include grains, on which a plane of a perovskite structure is observed, as crystal grains. In the cross-section, a percentage by number of the grains in the crystal grains is about 4% or more.