公开(公告)号：US20170023643A1

公开(公告)日：2017-01-26

申请号：US14836851

申请日：2015-08-26

Applicant: QUALCOMM Incorporated

Inventor： Rae-Ann Sobral LoCicero ,  Keith Barry ,  Ibrahim Shaik ,  Karthik Ranganathan Vishwanathan ,  Sajjad Pagarkar

IPC: G01R31/28 ,  G01R1/04

CPC classification number: G01R31/2893 ,  G01R1/0408 ,  G01R1/0416 ,  G01R31/2863 ,  G01R31/2886 ,  G01R31/2887

Abstract: A method and apparatus for testing electronic devices installed in a portable device. The apparatus incorporates a socket with receptacles for alignment pins, and an alignment plate with openings for the alignment pins. The holes for the alignment pins are matched to the socket receptacles, providing secure alignment. The spring loaded socket pin mates with at least one solder ball. The apparatus also includes a circuit card, which may be a modem test platform circuit card that has contacts that mate with the at least one solder ball. Other functions may be tested using other circuit card assemblies. A method of testing includes: installing the electronic device to be tested into a socket assembly, aligning the electronic device to be tested into the socket assembly; installing the socket assembly into a test apparatus, and testing the device.

Abstract translation: 一种用于测试安装在便携式设备中的电子设备的方法和设备。 该装置包括具有用于对准销的插座的插座和具有用于对准销的开口的对准板。 对准销的孔与插座插座相匹配，提供牢固的对准。 弹簧加载的插座针与至少一个焊球匹配。 该装置还包括电路卡，其可以是具有与至少一个焊球匹配的触点的调制解调器测试平台电路卡。 其他功能可以使用其他电路卡组件进行测试。 测试方法包括：将要测试的电子设备安装到插座组件中，将要测试的电子设备对准插座组件; 将插座组件安装到测试设备中，并测试设备。

公开(公告)号：US20160084880A1

公开(公告)日：2016-03-24

申请号：US14493265

申请日：2014-09-22

Applicant: QUALCOMM Incorporated

Inventor： Rae-Ann LoCicero ,  Keith Barry ,  Anthony Newman

IPC: G01R1/04 ,  G01R31/28

CPC classification number: G01R1/0466 ,  G01R31/2893

Abstract: An apparatus and method for facilitating testing of an electronic device is provided. The apparatus includes a strike plate with an integrated socket. Alignment dowels are located on an outside rim of the integrated strike plate and socket. Shims are located in a recess in the outside rim of the integrated strike plate and socket and may be used to adjust the height of the assembly to facilitate handling by an automated test handler. The apparatus further includes a memory nest assembly having a receptacle for retaining an electronic device to be tested. In addition, the memory nest assembly is formed to mate with the socket on the integrated strike plate.

Abstract translation: 提供一种便于电子设备测试的设备和方法。 该装置包括具有集成插座的冲击板。 定位销位于集成冲击板和插座的外边缘上。 垫片位于集成打击板和插座的外边缘中的凹部中，并且可以用于调节组件的高度以便于通过自动测试处理器的处理。 该装置还包括具有用于保持要测试的电子设备的插座的存储器嵌套组件。 此外，存储器套组件形成为与集成冲击板上的插座相配合。