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公开(公告)号：US12232019B2
公开(公告)日：2025-02-18
申请号：US17722173
申请日：2022-04-15
Applicant: Samsung Electronics Co., Ltd.
Inventor： Youngkyu Park , Gwangho Lee , Changhun Lee , Daejun Kang , Inshik Kang , Janggun Bae , Dongsuk Jung
Abstract: Various embodiments of the present disclosure relate to a device and method for controlling a communication function in an electronic device. An electronic device comprises: a wireless communication circuit for supporting first communication and second communication; memory; and at least one processor, the at least one processor configured to: check identification information about a network when connected to the network through the first communication, determine whether the network supports the second communication, on the basis of the identification information about the network and network information related to the second communication, set, on the basis of whether the network supports the second communication, whether a function, related to the second communication, of the electronic device is activated; and transmit, to the network information related to whether the function, related to the second communication, of the electronic device is activated.
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公开(公告)号：US12111270B2
公开(公告)日：2024-10-08
申请号：US17725917
申请日：2022-04-21
Applicant: Samsung Electronics Co., Ltd.
Inventor： Juntaek Oh , Jinwoo Ahn , Kijoo Hong , Youngkyu Park , Eunsoo Hwang
CPC classification number: G01N21/9501 , G01N21/21 , G01N21/55 , G01N2201/121
Abstract: A method of inspecting a wafer comprising measuring an intensity of an incident light and storing the measurement as stored incident light intensity, irradiating the incident light to the wafer, measuring an intensity of a reflected light from the wafer and storing the measurement as stored reflected light intensity, and correcting the stored reflected light intensity based on a difference between the stored incident light intensity and a reference intensity of a reference incident light.
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公开(公告)号：US20230204422A1
公开(公告)日：2023-06-29
申请号：US17955881
申请日：2022-09-29
Applicant: Samsung Electronics Co., Ltd.
Inventor： Jinwoo Ahn , Juntaek Oh , Youngkyu Park , Eunsoo Hwang
CPC classification number: G01J3/447 , G01N21/9501 , G01N21/211 , G01J3/021 , G01J3/0208 , G01N2021/213
Abstract: An imaging assembly of a spectral imaging ellipsometer includes an analyzer configured to polarize reflected light reflected from a sample surface, an imaging mirror optical system disposed on an optical path of the reflected light passing through the analyzer and including a first mirror having a concave surface and a second mirror having a convex surface, and a light detector configured to receive light passing through the imaging mirror optical system to collect spectral data. The reflected light is firstly reflected by the first mirror, the firstly reflected light is secondarily reflected by the second mirror and travels toward the first mirror again, and then thirdly reflected by the first mirror to be imaged on a light receiving surface of the light detector.
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公开(公告)号：US10732129B2
公开(公告)日：2020-08-04
申请号：US16250378
申请日：2019-01-17
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Kwang Soo Kim , Youngkyu Park , Sungho Jang , Byeonghwan Jeon
IPC: G01N21/956 , G03F7/20
Abstract: Disclosed are an apparatus for and a method of performing an inspection and metrology process. The apparatus may include a stage configured to load a substrate thereon, a sensor on the stage, an object lens between the sensor and the stage, a light source generating an illumination light to be transmitted to the substrate through the object lens, a first band filtering part between the light source and the object lens to control a wavelength of the illumination light within a first bandwidth, and a second band filtering part between the light source and the object lens to control a wavelength of the illumination light within a second bandwidth, which is smaller than the first bandwidth.
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