Memory device
    3.
    发明授权

    公开(公告)号:US10522562B2

    公开(公告)日:2019-12-31

    申请号:US16149249

    申请日:2018-10-02

    Abstract: A memory device includes a plurality of gate electrode layers stacked on a substrate, a plurality of channel layers penetrating the plurality of gate electrode layers, a gate insulating layer between the plurality of gate electrode layers and the plurality of channel layers, and a common source line on the substrate adjacent to the gate electrode layers. The common source line includes a first part and a second part that are alternately arranged in a first direction and have different heights in a direction vertical to a top surface of the substrate. The gate insulating layer includes a plurality of vertical parts and a horizontal part. The plurality of vertical parts surrounds corresponding ones of the plurality of channel layers. The horizontal part extends parallel to a top surface of the substrate.

    Vacuum cleaner
    4.
    发明授权

    公开(公告)号:US10098515B2

    公开(公告)日:2018-10-16

    申请号:US14695223

    申请日:2015-04-24

    Abstract: A vacuum cleaner having an improved structure capable of enhancing suction performance includes a suction unit provided in a main body, the suction unit including an impeller disposed to suck air by rotating about an axis thereof, and a diffuser disposed to guide air discharged from the impeller. The diffuser includes an inner casing, an outer casing disposed to be spaced apart from an outer circumference of the inner casing and to form a path through which the air discharged from the impeller flows, and a plurality of vanes disposed at the inner casing to guide the air discharged from the impeller to the path, and the plurality of vanes protrude toward the outer casing to cross at least a part of the path.

    Surface Profile Measurement System
    7.
    发明申请
    Surface Profile Measurement System 审中-公开
    表面轮廓测量系统

    公开(公告)号:US20140198322A1

    公开(公告)日:2014-07-17

    申请号:US14040098

    申请日:2013-09-27

    CPC classification number: G01B11/24

    Abstract: A profile measurement system includes a light source configured to generate light. A beam shaper configured to shape the light generated from the light source. A beam splitter configured to partially transmit and reflect the light shaped by the beam shaper. An object lens configured to receive the light from the beam splitter and irradiate the light to a stage in which a workpiece is mounted. A profile estimating part has a plurality of continuously varying focal points. The profile estimating part includes a focusing lens and a light detector configured to receive the light transmitted through the focusing lens.

    Abstract translation: 轮廓测量系统包括被配置为产生光的光源。 一种光束整形器,被配置成对从光源产生的光进行成形。 分束器,其被配置为部分地透射和反射由光束整形器成形的光。 一种被配置为从分束器接收光并将光照射到其中安装工件的台的物镜。 轮廓估计部具有多个连续变化的焦点。 轮廓估计部分包括聚焦透镜和配置成接收透过聚焦透镜的光的光检测器。

    Semiconductor memory device and method of manufacturing the same

    公开(公告)号:US10797071B2

    公开(公告)日:2020-10-06

    申请号:US16251337

    申请日:2019-01-18

    Abstract: A semiconductor memory device includes a peripheral circuit structure including a peripheral circuit insulating layer, a middle connection structure on the peripheral circuit insulating layer, the middle connection structure including a middle connection insulating layer, and a bottom surface of the middle connection insulating layer is in contact with a top surface of the peripheral circuit insulating layer, stack structures on sides of the middle connection structure, and channel structures extending vertically through each of the stack structures, wherein at least one side surface of the middle connection insulating layer is an inclined surface, a lateral sectional area of the middle connection insulating layer decreasing in an upward direction oriented away from the peripheral circuit insulating layer.

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