公开(公告)号：US20180350445A1

公开(公告)日：2018-12-06

申请号：US15610119

申请日：2017-05-31

Applicant: SANDISK TECHNOLOGIES LLC

Inventor： Daniel Linnen ,  Srikar Peesari ,  Kirubakaran Periyannan ,  Shantanu Gupta ,  Avinash Rajagiri ,  Dongxiang Liao ,  Jagdish Sabde ,  Rajan Paudel

IPC: G11C29/12 ,  G11C7/10

CPC classification number: G11C29/1201 ,  G11C7/10 ,  G11C7/22

Abstract: Techniques are presented for testing the high-speed data path between the IO pads and the read/write buffer of a memory circuit without the use of an external test device. In an on-chip process, a data test pattern is transferred at a high data rate between the read/write register and a source for the test pattern, such as register for this purpose or the read/write buffer of another plane. The test data after the high-speed transfer is then checked against its expected, uncorrupted value, such as by transferring it back at a lower speed for comparison or by transferring the test data a second time, but at a lower rate, and comparing the high transfer rate copy with the lower transfer rate copy at the receiving end of the transfers.

公开(公告)号：US10242750B2

公开(公告)日：2019-03-26

申请号：US15610119

申请日：2017-05-31

Applicant: SANDISK TECHNOLOGIES LLC

Inventor： Daniel Linnen ,  Srikar Peesari ,  Kirubakaran Periyannan ,  Shantanu Gupta ,  Avinash Rajagiri ,  Dongxiang Liao ,  Jagdish Sabde ,  Rajan Paudel

IPC: G11C29/12 ,  G11C7/10 ,  G11C7/22

Abstract: Techniques are presented for testing the high-speed data path between the IO pads and the read/write buffer of a memory circuit without the use of an external test device. In an on-chip process, a data test pattern is transferred at a high data rate between the read/write register and a source for the test pattern, such as register for this purpose or the read/write buffer of another plane. The test data after the high-speed transfer is then checked against its expected, uncorrupted value, such as by transferring it back at a lower speed for comparison or by transferring the test data a second time, but at a lower rate, and comparing the high transfer rate copy with the lower transfer rate copy at the receiving end of the transfers.