CONTINUITY TEST IN ELECTRONIC DEVICES WITH MULTIPLE-CONNECTION LEADS
    1.
    发明申请
    CONTINUITY TEST IN ELECTRONIC DEVICES WITH MULTIPLE-CONNECTION LEADS 有权
    具有多个连接导线的电子设备的连续性测试

    公开(公告)号:US20130335107A1

    公开(公告)日:2013-12-19

    申请号:US13913883

    申请日:2013-06-10

    Abstract: An electronic device includes an electronic component having terminals including a set of first terminals and a set of second terminals, a protective package embedding the electronic component, leads exposed from the protective package including a set of first leads and a set of second leads, for each first lead a first electrical connection inside the protection package between the first lead and a corresponding one of the first terminals, and for each second lead electrical connections inside the protective package each one between the second lead and a corresponding one of the second terminals. For each second lead the electronic component includes test structures, each being coupled between a corresponding one of the second terminals connected to the second lead and a corresponding test one of the first terminals connected to a test one of the first leads.

    Abstract translation: 电子设备包括具有终端的电子部件,该端子包括一组第一端子和一组第二端子,嵌入电子部件的保护封装件,从包括一组第一引线和一组第二引线的保护封装暴露的引线,用于 每个首先在第一引线和相应的一个第一端子之间的保护封装内部引导第一电连接,并且对于保护封装内部的每个第二引线电连接,每个在第二引线和相应的一个第二端子之间引导。 对于每个第二引线,电子部件包括测试结构,每个测试结构耦合在连接到第二引线的相应的一个第二端子和与第一引线中的一个测试引线连接的第一端子中的相应测试的一个引线之间。

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