公开(公告)号：US11965923B2

公开(公告)日：2024-04-23

申请号：US17581553

申请日：2022-01-21

Applicant: STMICROELECTRONICS S.r.l.

Inventor： Fabio Passaniti ,  Daniele De Pascalis ,  Enrico Rosario Alessi

IPC: G01R29/24

CPC classification number: G01R29/24

Abstract: The present disclosure is directed to self-tests for electrostatic charge variation sensors. The self-tests ensure an electrostatic charge variation sensor is functioning properly. The self-tests may be performed while an electrostatic charge variation sensor is active and without interruption to the application employing the electrostatic charge variation sensor.

公开(公告)号：US08981834B2

公开(公告)日：2015-03-17

申请号：US14134972

申请日：2013-12-19

Applicant: STMicroelectronics S.r.l.

Inventor： Giuseppe Spinella ,  Daniele De Pascalis ,  Marco Vito Sapienza ,  Maria Ceravolo ,  Eugenio Miluzzi

IPC: H01L41/00 ,  G05F1/625 ,  G01P15/125 ,  G01D5/244

CPC classification number: G05F1/625 ,  G01D5/2448 ,  G01P15/125

Abstract: An offset-compensation circuit in a MEMS sensor device, provided with a micromechanical detection structure that transduces a quantity to be detected into an electrical detection quantity, and with an electronic reading circuit, coupled to the micromechanical detection structure for processing the electrical detection quantity and supplying an output signal, which is a function of the quantity to be detected. A compensation structure is electrically coupled to the input of the electronic reading circuit and can be controlled for generating an electrical compensation quantity, of a trimmable value, for compensating an offset on the output signal; the compensation circuit has a control unit, which reads the output signal during operation of the MEMS sensor device; obtains information on the offset present on the output signal itself; and controls the compensation structure as a function of the offset information.

Abstract translation: MEMS传感器装置中的偏移补偿电路，其具有将要检测的量转换为电检测量的微机械检测结构，以及耦合到微机械检测结构的电子读取电路，用于处理电检测量;以及 提供作为要检测的量的函数的输出信号。 补偿结构电耦合到电子阅读电路的输入，并且可以被控制以产生可修整值的电补偿量，用于补偿输出信号上的偏移; 补偿电路具有控制单元，其在MEMS传感器设备的操作期间读取输出信号; 获取关于输出信号本身的偏移量的信息; 并且将补偿结构控制为偏移信息的函数。

公开(公告)号：US20140176231A1

公开(公告)日：2014-06-26

申请号：US14134972

申请日：2013-12-19

Applicant: STMicroelectronics S.r.l.

Inventor： Giuseppe Spinella ,  Daniele De Pascalis ,  Marco Vito Sapienza ,  Maria Ceravolo ,  Eugenio Miluzzi

IPC: G05F1/625

CPC classification number: G05F1/625 ,  G01D5/2448 ,  G01P15/125

Abstract: An offset-compensation circuit in a MEMS sensor device, provided with a micromechanical detection structure that transduces a quantity to be detected into an electrical detection quantity, and with an electronic reading circuit, coupled to the micromechanical detection structure for processing the electrical detection quantity and supplying an output signal, which is a function of the quantity to be detected. A compensation structure is electrically coupled to the input of the electronic reading circuit and can be controlled for generating an electrical compensation quantity, of a trimmable value, for compensating an offset on the output signal; the compensation circuit has a control unit, which reads the output signal during operation of the MEMS sensor device; obtains information on the offset present on the output signal itself; and controls the compensation structure as a function of the offset information.

Abstract translation: MEMS传感器装置中的偏移补偿电路，其具有将要检测的量转换为电检测量的微机械检测结构，以及耦合到微机械检测结构的电子读取电路，用于处理电检测量;以及 提供作为要检测的量的函数的输出信号。 补偿结构电耦合到电子阅读电路的输入，并且可以被控制以产生可修整值的电补偿量，用于补偿输出信号上的偏移; 补偿电路具有控制单元，其在MEMS传感器设备的操作期间读取输出信号; 获取关于输出信号本身的偏移量的信息; 并且将补偿结构控制为偏移信息的函数。