公开(公告)号：US20190195641A1

公开(公告)日：2019-06-27

申请号：US16159896

申请日：2018-10-15

Applicant: Samsung Electronics Co., Ltd.

Inventor： Jungmin KIM ,  Taeho KWON ,  Seongyeol PARK ,  Jinwoo JEON ,  Youngbin CHO ,  Doosuk KANG ,  Gajin SONG

IPC: G01C21/34 ,  G01C21/36 ,  H04W4/024 ,  B60W50/14 ,  G06F17/30 ,  G08G1/01

CPC classification number: G01C21/3415 ,  B60W50/14 ,  B60W2050/146 ,  G01C21/3694 ,  G01S19/45 ,  G06F16/24575 ,  G06F16/248 ,  G06F16/9535 ,  G08G1/0133 ,  H04W4/024

Abstract: The present disclosure relates to an electronic device and method for a vehicle. The electronic devices includes a wireless communication circuit, at least one processor operatively coupled to the wireless communication circuit, a sensor, and a memory operatively coupled to the at least one processor. The processor implements the method, including detecting by the sensor whether the vehicle arrives at a destination location, when the vehicle arrives at the destination location, transmitting to the vehicle a request for operation data of the vehicle, after receiving the operation data from the vehicle, detecting based on the received operation data whether the vehicle is deactivated, and transmitting at least a part of the data to an external server using the wireless communication circuit.

公开(公告)号：US20130082717A1

公开(公告)日：2013-04-04

申请号：US13644793

申请日：2012-10-04

Applicant: SAMSUNG ELECTRONICS CO. LTD.

Inventor： Jungmin KIM ,  Keonyoung SEO ,  Kwangmo YANG ,  Byeonghwan KANG ,  Bonghee PARK

IPC: G01R31/02

CPC classification number: G01R31/001 ,  G01R29/0871 ,  G01R31/002 ,  H04M1/24

Abstract: A method and an apparatus for measuring performance of an electronic device are provided. The apparatus includes an electromagnetic wave measuring device for measuring an actual level of an electromagnetic wave of an electronic device, and an analysis controller for applying a previously stored level change value to the actual level of the electromagnetic wave to compute a measured level of the electromagnetic wave. The method and the apparatus for measuring performance of an electronic device can easily measure an electromagnetic wave level of the electronic device without using a device suggested by an international standard.

Abstract translation: 提供了一种用于测量电子设备性能的方法和装置。 该装置包括用于测量电子设备的电磁波的实际电平的电磁波测量装置和用于将预先存储的电平变化值应用于电磁波的实际电平的分析控制器，以计算电磁波的测量电平 波。 用于测量电子设备性能的方法和装置可以容易地测量电子设备的电磁波水平，而不使用国际标准建议的设备。

公开(公告)号：US20230028712A1

公开(公告)日：2023-01-26

申请号：US17701520

申请日：2022-03-22

Applicant: Samsung Electronics Co., Ltd.

Inventor： Sooyong LEE ,  Dongho KIM ,  Sangwook KIM ,  Jungmin KIM ,  Seunghune YANG ,  Jeeyong LEE ,  Changmook YIM ,  Yangwoo HEO

IPC: G06F30/392 ,  G03F7/20

Abstract: Disclosed is an operating method of an electronic device which includes receiving a design layout for manufacturing the semiconductor device, generating a first layout by performing machine learning-based process proximity correction (PPC), generating a second layout by performing optical proximity correction (OPC), and outputting the second layout for a semiconductor process. The generating of the first layout includes generating a first after cleaning inspection (ACI) layout by executing a machine learning-based process proximity correction module on the design layout, generating a second after cleaning inspection layout by adjusting the design layout based on a difference of the first after cleaning inspection layout and the design layout and executing the process proximity correction module on the adjusted layout, and outputting the adjusted layout as the first layout, when a difference between the second after cleaning inspection layout and the design layout is smaller than or equal to a threshold value.