公开(公告)号：US11995248B2

公开(公告)日：2024-05-28

申请号：US18137473

申请日：2023-04-21

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Junho Jung ,  Sungjin Son ,  Minwoo Lee ,  Jooheon Lee ,  Hyunseok Cha

IPC: G06F3/03 ,  G06F3/0362 ,  H04N21/231 ,  H04N21/422 ,  H04N21/466

CPC classification number: G06F3/0312 ,  G06F3/0362 ,  H04N21/231 ,  H04N21/42204 ,  H04N21/4667

Abstract: A user interface device and method for controlling a screen by a wheel input signal in a display device. The display device, based on wheel events that continuously occur according to manipulation of a wheel input device by a user reaching a reference number, obtains an average interval of intervals between occurrence times at which the wheel events occur, respectively. The display device displays a result of performing a continuous operation through a display based on the obtained average interval being shorter than a reference interval.

公开(公告)号：US20210020258A1

公开(公告)日：2021-01-21

申请号：US16781184

申请日：2020-02-04

Applicant: Samsung Electronics Co., Ltd.

Inventor： Jihyuk OH ,  Jiseok Kang ,  Junho Jung

IPC: G11C29/10 ,  G06F13/16

Abstract: A memory module includes at least one semiconductor memory device, and a test pattern memory that stores first test pattern information for testing the at least one semiconductor memory device, and the first test pattern information stored in the test pattern memory is transferred to a host in a test operation. Through the memory module having the above-described function, a memory test is possible in consideration of a unique weak characteristic of the memory module.

公开(公告)号：US11328786B2

公开(公告)日：2022-05-10

申请号：US16781184

申请日：2020-02-04

Applicant: Samsung Electronics Co., Ltd.

Inventor： Jihyuk Oh ,  Jiseok Kang ,  Junho Jung

IPC: G11C29/10 ,  G06F13/16

Abstract: A memory module includes at least one semiconductor memory device, and a test pattern memory that stores first test pattern information for testing the at least one semiconductor memory device, and the first test pattern information stored in the test pattern memory is transferred to a host in a test operation. Through the memory module having the above-described function, a memory test is possible in consideration of a unique weak characteristic of the memory module.

公开(公告)号：USD993221S1

公开(公告)日：2023-07-25

申请号：US29843894

申请日：2022-06-24

Applicant: Samsung Electronics Co., Ltd.

Designer： Bumho Chun ,  Wongeun Ryu ,  Hyonam Yoo ,  Youngjin Lee ,  Junho Jung ,  Hyoungwoong Jo

Abstract: FIG. 1 is a front perspective view of a remote control showing our new design;
FIG. 2 is a front view thereof;
FIG. 3 is a rear view thereof;
FIG. 4 is a left-side view thereof;
FIG. 5 is a right-side view thereof;
FIG. 6 is a top view thereof;
FIG. 7 is a bottom view thereof;
FIG. 8 is an exploded front perspective view in which the top portion is shown separated from the bottom portion of the remote control;
FIG. 9 is an enlarged view of the encircled portion 9 of FIG. 1; and,
FIG. 10 is an enlarged view of the encircled portion 10 of FIG. 6.
The broken lines in the figures depict portions of the remote control which form no part of the claimed design.
The dot-dash broken lines in the figures represent a boundary line and form no part of the claimed design.
The dot-dot-dash broken lines encircling portions of the claimed design that are illustrated in enlargements form no part of the claimed design.