公开(公告)号：US11798645B2

公开(公告)日：2023-10-24

申请号：US17467968

申请日：2021-09-07

Applicant: Samsung Electronics Co., Ltd.

Inventor： Jiseok Lee ,  Hwangju Song ,  Namyong Kim ,  Jaeeun Yoon ,  Sangmu Lee ,  Sangwon Hwang

IPC: G11C29/42 ,  G11C29/12 ,  G11C16/34 ,  G11C16/26 ,  G11C16/10

CPC classification number: G11C29/42 ,  G11C16/102 ,  G11C16/26 ,  G11C16/3495 ,  G11C29/12005

Abstract: A storage device for performing a reliability check by using error correction code (ECC) data is provided. The storage device includes a memory controller configured to detect the number of errors of second read data read out by a second read operation, based on ECC data of first read data read by a first read operation of a memory device. The memory controller includes a memory check circuit that includes a counter configured to count states of memory cells, a comparator configured to compare respective count numbers of the states with one another, and a register configured to store the number of errors based on a result of the comparison.