Method of fabricating semiconductor device
    1.
    发明授权
    Method of fabricating semiconductor device 有权
    制造半导体器件的方法

    公开(公告)号:US09443732B1

    公开(公告)日:2016-09-13

    申请号:US14452243

    申请日:2014-08-05

    摘要: The method may include forming a plurality of fins on a substrate with first and second regions, forming a photoresist pattern to expose the fins of the first region, forming a material layer to cover the fins of first region and the photoresist pattern, chemically reacting the photoresist pattern the material layer to form a supplemental film on a side surface of the photoresist pattern, performing an ion implantation process using the photoresist pattern and the supplemental film as a ion injection mask to form impurity layers in the fins of the first region.

    摘要翻译: 该方法可以包括在第一和第二区域的基板上形成多个翅片,形成光致抗蚀剂图案以暴露第一区域的散热片,形成覆盖第一区域和光致抗蚀剂图案的散热片的材料层,使 光致抗蚀剂图案化材料层以在光致抗蚀剂图案的侧表面上形成补充膜,使用光致抗蚀剂图案和补充膜作为离子注入掩模进行离子注入工艺,以在第一区域的散热片中形成杂质层。