摘要:
Various methods and apparatuses are described for a system that includes some on-chip components, e.g., I-Os, test processors, soft wrappers, etc., an external testing unit that provides Parametric Measurement Unit (PMU) capability, and various tests performed on the I-Os by the on-chip testing logic, the test vector patterns supplied by the external testing unit.
摘要:
The present subject matter is directed to methodologies for measuring jitter spectral content in a sampled signal using continuous time interval analyzers (CTIA) for characterization and test of clock signals and high-speed digital interfaces. The methodology takes advantage of anti-aliasing aspects of random sampling (RS) in a time interval error (TIE) based analysis methodology by randomizing timing of samples relative to signal edges and/or intervals between signal edges.
摘要:
Various methods and apparatuses are described for a system that includes some on-chip components, e.g., I/Os, test processors, soft wrappers, etc., an external testing unit that provides Parametric Measurement Unit (PMU) capability, a Device Interface Board (DIB) that includes resistors between the chip and the external tester, and various tests performed on the I/Os by the on-chip testing logic and external testing unit facilitated through the DIB.
摘要:
Various methods and apparatuses are described for a system that includes some on-chip components, e.g., I-Os, test processors, soft wrappers, etc., an external testing unit that provides Parametric Measurement Unit (PMU) capability, and various tests performed on the I-Os by the on-chip testing logic, the test vector patterns supplied by the external testing unit.
摘要:
Disclosed is a system and related methodology for providing fast low frequency jitter rejection in the measurement of signals under test. A signal under test may be sampled alternately with a reference signal under similar conditions. The resulting sampled signal blocks may then be processed to subtract the known calibrated value of the reference signal from the average signal under test.
摘要:
Methodologies are disclosed for analyzing periodic jitter is a signal pattern using a continuous time interval analyzer. Sampled signal patterns may be correlated using time interval error calculations to determine start and stop sequences within sampled blocks of signal data while sampling synchronization may be achieved based on time interval calculations or pattern interval error calculations.
摘要:
Methods for estimating data-dependent jitter (DDJ) from measured samples of a transmitted data signal include a first exemplary step of obtaining a plurality of measurements (e.g., time tags and event counts for selected pulse widths in the data signal). Such measurements may be obtained at predetermined intervals within a transmitted signal or may be obtained at randomly selected intervals, and should yield measurements for each data pulse in a repeating data pattern. An average unit interval value representative of the average bit time of the transmitted signal is determined. Time interval error estimates representative of the timing deviation from each signal edge's measured value relative to its ideal value (determined in part from the calculated average unit interval value) are also determined, as well as a classification for each measured signal edge relative to a corresponding data pulse in the repeating data pattern. DDJ delta lines are then calculated for signal edges of each pulse width in the transmitted data pattern, from which peak-to-peak DDJ values and/or estimates of duty-cycle-distortion (DCD) can be determined.
摘要:
Disclosed is a system and related methodology for providing fast low frequency jitter rejection in the measurement of signals under test. A signal under test may be sampled alternately with a reference signal under similar conditions. The resulting sampled signal blocks may then be processed to subtract the known calibrated value of the reference signal from the average signal under test.
摘要:
The present subject matter is directed to a high-speed high resolution and accuracy time interpolator circuit. The interpolator uses basic dual ramp time-to-digital converter architecture, but provides circuits and methodologies to improve the accuracy, reduce the effective intrinsic jitter, and reduce the measurement time. Improved aspects of the present subject matter correspond to the introduction of a current mirror for improved settling time, a high frequency clock for improved resolution and ADC sample processing to improve resolution and accuracy.
摘要:
The present subject matter is directed to a high-speed high resolution and accuracy time interpolator circuit. The interpolator uses basic dual ramp time-to-digital converter architecture, but provides circuits and methodologies to improve the accuracy, reduce the effective intrinsic jitter, and reduce the measurement time. Improved aspects of the present subject matter correspond to the introduction of a current mirror for improved settling time, a high frequency clock for improved resolution and ADC sample processing to improve resolution and accuracy.