摘要:
A pixel driving method applied to a flat panel display is provided. In a first time period, an Nth scan line provides a first scan voltage to a pixel row to conduct the corresponding thin film transistors (TFT). Also, an N+1th scan line provides a second scan voltage through the conducted TFTs to the corresponding first switches to conduct the first switches, and then a number of first data voltages of the corresponding data lines are outputted to the corresponding first pixel electrodes. The absolute value of the difference between the first scan voltage and the second scan voltage is not smaller than a threshold voltage of each TFTs.
摘要:
A pixel driving method applied to a flat panel display is provided. In a first time period, an Nth scan line provides a first scan voltage to a pixel row to conduct the corresponding thin film transistors (TFT). Also, an N+1th scan line provides a second scan voltage through the conducted TFTs to the corresponding first switches to conduct the first switches, and then a number of first data voltages of the corresponding data lines are outputted to the corresponding first pixel electrodes. The absolute value of the difference between the first scan voltage and the second scan voltage is not smaller than a threshold voltage of each TFTs.
摘要:
A protection circuit of an LCD panel. The LCD panel includes a display cell coupled between a data electrode, a gate electrode and a common electrode. A switch includes a first terminal and a second terminal. The first terminal is coupled to the data electrode, the gate electrode or both. The switch is turned on when a voltage level of the first terminal or the second terminal exceeds a threshold voltage. An ESD protection circuit includes a capacitive load and a resistive load, coupled between the second terminal and the common electrode.
摘要:
A testing apparatus for flat-panel display is disclosed. The flat-panel display at least comprises a plurality of electrode lines and a plurality of driving circuits. The driving circuits are used to drive the electrode lines. The driving circuits and the testing apparatus are disposed on the opposite sides of the flat-panel display. The testing apparatus comprises a plurality of switching components and at least one shorting bar. The shorting bar electrically couples to the electrode lines through the switching components. When the switching components are thin film transistor, the switching components further comprise at least one switching line. The switching line electrically couples to the gates of the thin film transistors. The electrode lines are divided into several groups to electrically couple to the shorting bar and the switching line, for example.
摘要:
In a method of making device of a display, an insulating layer, a semiconductor layer, an ohmic contact layer, a second conductive layer, and a photoresist pattern are consecutively formed on a first conductive structure. The photoresist pattern includes a first thickness region, and a second thickness region outside the first thickness region. The thickness of the second thickness region is smaller than that of the first thickness region. In addition, in a gate driver on array (GOA) of a display, it includes a gate driver on array structure with a pull-down transistor. The pull-down transistor has a gate electrode, a semiconductor island, a source electrode and a drain electrode. The semiconductor island extends out of the edges of the gate electrode, the source electrode, and the drain electrode.
摘要:
A gate driver on array of a display includes a substrate having a peripheral region, and a gate driver on array structure formed in the peripheral region. The gate driver on array structure includes a pull-down transistor, and the pull-down transistor has a gate electrode, an insulating layer, a semiconductor island, a source electrode, and a drain electrode. The semiconductor island extends out of both edges of the gate electrode, and extends out of an edge of the source electrode and an edge of the drain electrode.
摘要:
In a method of making device of a display, an insulating layer, a semiconductor layer, an ohmic contact layer, a second conductive layer, and a photoresist pattern are consecutively formed on a first conductive structure. The photoresist pattern includes a first thickness region, and a second thickness region outside the first thickness region. The thickness of the second thickness region is smaller than that of the first thickness region. In addition, in a gate driver on array (GOA) of a display, it includes a gate driver on array structure with a pull-down transistor. The pull-down transistor has a gate electrode, a semiconductor island, a source electrode and a drain electrode. The semiconductor island extends out of the edges of the gate electrode, the source electrode, and the drain electrode.
摘要:
A gate driver on array of a display includes a substrate having a peripheral region, and a gate driver on array structure formed in the peripheral region. The gate driver on array structure includes a pull-down transistor, and the pull-down transistor has a gate electrode, an insulating layer, a semiconductor island, a source electrode, and a drain electrode. The semiconductor island extends out of both edges of the gate electrode, and extends out of an edge of the source electrode and an edge of the drain electrode.
摘要:
A protection circuit of an LCD panel. The LCD panel includes a display cell coupled between a data electrode, a gate electrode and a common electrode. A switch includes a first terminal and a second terminal. The first terminal is coupled to the data electrode, the gate electrode or both. The switch is turned on when a voltage level of the first terminal or the second terminal exceeds a threshold voltage. An ESD protection circuit includes a capacitive load and a resistive load, coupled between the second terminal and the common electrode.
摘要:
A testing apparatus for flat-panel display is disclosed. The flat-panel display at least comprises a plurality of electrode lines and a plurality of driving circuits. The driving circuits are used to drive the electrode lines. The driving circuits and the testing apparatus are disposed on the opposite sides of the flat-panel display. The testing apparatus comprises a plurality of switching components and at least one shorting bar. The shorting bar electrically couples to the electrode lines through the switching components. When the switching components are thin film transistor, the switching components further comprise at least one switching line. The switching line electrically couples to the gates of the thin film transistors. The electrode lines are divided into several groups to electrically couple to the shorting bar and the switching line, for example.