Abstract:
Various regions or pockets are defined within a substrate that comprises an integral body of semiconductor material. The regions extend to a surface of the substrate and are isolated one from another by dielectric layers that enclose each region, extending to the surface of the substrate around the periphery of each region. In one aspect of the invention the dielectric layer extends to the surface of the substrate at an acute angle thereto. The dielectric layer is formed using ion implantation techniques to implant selected ions to a desired depth in the substrate where they combine with the semiconductor material to form an insulating compound.