公开(公告)号：US20190011493A1

公开(公告)日：2019-01-10

申请号：US16130035

申请日：2018-09-13

Applicant: Texas Instruments Incorporated

Inventor： Alex PAIKIN ,  Colin JOHNSON ,  Tathagata CHATTERJEE ,  Sameer PENDHARKAR

IPC: G01R31/26 ,  G01R31/28

CPC classification number: G01R31/2628 ,  G01R31/2642 ,  G01R31/2849

Abstract: In at least some embodiments, a system comprises a socket gate terminal configured to receive a first voltage to activate and inactivate a device under test (DUT) coupled to the socket gate terminal. The system also comprises a socket source terminal configured to provide a reference voltage to the DUT. The system further comprises a socket drain terminal configured to provide a second voltage to the DUT to stress the DUT when the DUT is inactive. The socket drain terminal is further configured to receive a third voltage to cause a current to flow through a pathway in the DUT between the socket drain terminal and the socket source terminal when the DUT is active. The socket drain terminal is further configured to provide a fourth voltage indicative of a resistance of the pathway in the DUT when the DUT is active and is heated to a temperature above an ambient temperature associated with the system.

公开(公告)号：US20180188313A1

公开(公告)日：2018-07-05

申请号：US15395907

申请日：2016-12-30

Applicant: TEXAS INSTRUMENTS INCORPORATED

Inventor： Alex PAIKIN ,  Colin JOHNSON ,  Tathagata CHATTERJEE ,  Sameer PENDHARKAR

IPC: G01R31/26 ,  G01R31/28

CPC classification number: G01R31/2628 ,  G01R31/2849

Abstract: In at least some embodiments, a system comprises a socket gate terminal configured to receive a first voltage to activate and inactivate a device under test (DUT) coupled to the socket gate terminal. The system also comprises a socket source terminal configured to provide a reference voltage to the DUT. The system further comprises a socket drain terminal configured to provide a second voltage to the DUT to stress the DUT when the DUT is inactive. The socket drain terminal is further configured to receive a third voltage to cause a current to flow through a pathway in the DUT between the socket drain terminal and the socket source terminal when the DUT is active. The socket drain terminal is further configured to provide a fourth voltage indicative of a resistance of the pathway in the DUT when the DUT is active and is heated to a temperature above an ambient temperature associated with the system.