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公开(公告)号:US20250118609A1
公开(公告)日:2025-04-10
申请号:US18410301
申请日:2024-01-11
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Hsin Chang , Po-Han Wang , Yu-Hsiang Hu , Hung-Jui Kuo
IPC: H01L23/31 , H01L23/00 , H01L23/498 , H01L23/522 , H01L25/00 , H01L25/065
Abstract: A method of forming a semiconductor package includes: surrounding a die with a molding material; and forming a redistribution structure (RDS) over the molding material and electrically coupled to the die, which includes: depositing a first dielectric layer over the molding material; patterning the first dielectric layer to form first openings in the first dielectric layer; performing a first descum process to clean the first openings; after performing the first descum process, forming a first redistribution layer (RDL) on the first dielectric layer; depositing a second dielectric layer over the molding material; patterning the second dielectric layer to form second openings in the second dielectric layer; performing a second descum process to clean the second openings, where the first and second descum processes are performed under different process conditions; and after performing the second descum process, forming a second RDL on the second dielectric layer.
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公开(公告)号:US20200321249A1
公开(公告)日:2020-10-08
申请号:US16908348
申请日:2020-06-22
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Hsin Chang , Fang Wen Tsai , Jing-Cheng Lin , Wen-Chih Chiou , Shin-Puu Jeng
IPC: H01L21/768 , H01L23/48 , H01L23/544 , H01L23/00 , H01L21/683
Abstract: A device includes a substrate, and an alignment mark including a conductive through-substrate via (TSV) penetrating through the substrate.
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公开(公告)号:US10910267B2
公开(公告)日:2021-02-02
申请号:US16908348
申请日:2020-06-22
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Hsin Chang , Fang Wen Tsai , Jing-Cheng Lin , Wen-Chih Chiou , Shin-Puu Jeng
IPC: H01L21/768 , H01L23/544 , H01L23/00 , H01L21/683 , H01L23/48 , H01L23/498
Abstract: A device includes a substrate, and an alignment mark including a conductive through-substrate via (TSV) penetrating through the substrate.
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