公开(公告)号：US20220299566A1

公开(公告)日：2022-09-22

申请号：US17695633

申请日：2022-03-15

Applicant: Tektronix, Inc.

Inventor： Mark L. Guenther

IPC: G01R31/317 ,  G01R31/319 ,  G01R31/3183

Abstract: A test and measurement device includes an input for receiving a test waveform from a Device Under Test (DUT), where the test waveform has a plurality of input level transitions, a selector structured to respectively and individually extract only those portions of the test waveform that match two or more predefined patterns of input level transitions of the test waveform, a noise compensator structured to individually determine and remove, for each of the extracted portions of the waveform, a component of a jitter measurement caused by random noise of the test and measurement device receiving the test waveform, a summer structured to produce a composite distribution of timing measurements with removed noise components from the extracted portions of the test waveform, and a jitter processor structured to determine a first noise-compensated jitter measurement of the DUT from the composite distribution. Methods of determining noise-compensated jitter measurements are also disclosed.

公开(公告)号：US09294237B2

公开(公告)日：2016-03-22

申请号：US14552265

申请日：2014-11-24

Applicant: Tektronix, Inc.

Inventor： Mark L. Guenther ,  Kan Tan

IPC: H04L1/20

CPC classification number: H04L1/205 ,  G01R13/0272 ,  G01R13/029 ,  G01R29/26 ,  G01R31/31709 ,  G01R31/3171 ,  G01R31/31711

Abstract: A method for determining jitter and noise of an input signal. The method includes acquiring one or more uncorrelated waveform records by an acquisition unit of a test and measurement instrument, determining a correlated waveform from the acquired waveform(s), dividing the correlated waveform into unit intervals, dividing an uncorrelated waveform into unit intervals, measuring a timing displacement (t1) between the correlated waveform and the uncorrelated waveform for each unit interval to form an apparent-jitter array ([t1]), measuring a voltage displacement (V1) between the correlated waveform and the uncorrelated waveform for reach unit interval to form an apparent-noise array ([V1]), calculating a horizontal shift (ts) between the correlated waveform and the uncorrelated waveform for each unit interval to form a compensated edge time array ([ts]), and calculating a vertical shift (Vs) between the correlated waveform and the uncorrelated waveform for each unit interval to form a compensated amplitude voltage array ([Vs]).

Abstract translation: 一种用于确定输入信号的抖动和噪声的方法。 该方法包括由测试和测量仪器的获取单元获取一个或多个不相关的波形记录，从获取的波形确定相关波形，将相关波形划分为单位间隔，将不相关波形划分为单位间隔，测量 相关波形和每个单位间隔的不相关波形之间的定时位移（t1），以形成视在抖动阵列（[t1]），测量相关波形与达不到单位间隔的不相关波形之间的电压位移（V1） 为了形成视差噪声阵列（[V1]），计算每个单位间隔的相关波形和不相关波形之间的水平偏移（ts），以形成补偿边缘时间阵列（[ts]），并计算垂直偏移 （Vs），以形成补偿振幅电压阵列（[Vs]）。

公开(公告)号：US20160036568A1

公开(公告)日：2016-02-04

申请号：US14552265

申请日：2014-11-24

Applicant: Tektronix, Inc.

Inventor： Mark L. Guenther ,  Kan Tan

IPC: H04L1/20

CPC classification number: H04L1/205 ,  G01R13/0272 ,  G01R13/029 ,  G01R29/26 ,  G01R31/31709 ,  G01R31/3171 ,  G01R31/31711

Abstract: A method for determining jitter and noise of an input signal. The method includes acquiring one or more uncorrelated waveform records by an acquisition unit of a test and measurement instrument, determining a correlated waveform from the acquired waveform(s), dividing the correlated waveform into unit intervals, dividing an uncorrelated waveform into unit intervals, measuring a timing displacement (t1) between the correlated waveform and the uncorrelated waveform for each unit interval to form an apparent-jitter array ([t1]), measuring a voltage displacement (V1) between the correlated waveform and the uncorrelated waveform for reach unit interval to form an apparent-noise array ([V1]), calculating a horizontal shift (ts) between the correlated waveform and the uncorrelated waveform for each unit interval to form a compensated edge time array ([ts]), and calculating a vertical shift (Vs) between the correlated waveform and the uncorrelated waveform for each unit interval to form a compensated amplitude voltage array ([Vs]).

Abstract translation: 一种用于确定输入信号的抖动和噪声的方法。 该方法包括由测试和测量仪器的获取单元获取一个或多个不相关的波形记录，从获取的波形确定相关波形，将相关波形划分为单位间隔，将不相关波形划分为单位间隔，测量 相关波形和每个单位间隔的不相关波形之间的定时位移（t1），以形成视在抖动阵列（[t1]），测量相关波形与达不到单位间隔的不相关波形之间的电压位移（V1） 为了形成视差噪声阵列（[V1]），计算每个单位间隔的相关波形和不相关波形之间的水平偏移（ts），以形成补偿边缘时间阵列（[ts]），并计算垂直偏移 （Vs），以形成补偿振幅电压阵列（[Vs]）。

公开(公告)号：US20240369625A1

公开(公告)日：2024-11-07

申请号：US18654577

申请日：2024-05-03

Applicant: Tektronix, Inc.

Inventor： Mark L. Guenther

IPC: G01R31/317

Abstract: A method and system of separating and determining components total jitter for a signal under test includes determining a time interval error (TIE) spectrum for the signal under test. The TIE spectrum includes a plurality of frequency bins. The method identifies frequency bins in the TIE spectrum containing deterministic jitter. The method includes determining components of total jitter for the signal under test based on frequency bins in an N-UI spectrum for the signal under test corresponding to the identified frequency bins in the TIE spectrum.

公开(公告)号：US20240255572A1

公开(公告)日：2024-08-01

申请号：US18407266

申请日：2024-01-08

Applicant: Tektronix, Inc.

Inventor： Muhammad Saad Chughtai ,  Mark L. Guenther ,  Pavel R. Zivny

IPC: G01R31/317 ,  G01R13/02 ,  G01R29/26

CPC classification number: G01R31/31709 ,  G01R13/02 ,  G01R29/26

Abstract: A test and measurement instrument includes one or more ports to allow the instrument to connect to a DUT, a memory, a user interface including a display to display waveform signals received from the DUT and controls to allow a user to select settings for the instrument, and one or more processors configured to execute code that causes the one or more processors to: receive a signal from the DUT having multiple signal levels and multiple jitter thresholds; and adjust each measurement of the signal from the DUT using a jitter compensation value for each jitter threshold to produce a final measurement. A method includes receiving a waveform signal having multiple signal levels and multiple jitter thresholds from a device under test (DUT), and adjusting measurements of each level of the signal using a jitter compensation value for each level to produce final measurements.

公开(公告)号：US11624781B2

公开(公告)日：2023-04-11

申请号：US17695633

申请日：2022-03-15

Applicant: Tektronix, Inc.

Inventor： Mark L. Guenther

IPC: G01R31/28 ,  G01R31/317 ,  G01R31/3183 ,  G01R31/319

Abstract: A test and measurement device includes an input for receiving a test waveform from a Device Under Test (DUT), where the test waveform has a plurality of input level transitions, a selector structured to respectively and individually extract only those portions of the test waveform that match two or more predefined patterns of input level transitions of the test waveform, a noise compensator structured to individually determine and remove, for each of the extracted portions of the waveform, a component of a jitter measurement caused by random noise of the test and measurement device receiving the test waveform, a summer structured to produce a composite distribution of timing measurements with removed noise components from the extracted portions of the test waveform, and a jitter processor structured to determine a first noise-compensated jitter measurement of the DUT from the composite distribution. Methods of determining noise-compensated jitter measurements are also disclosed.

公开(公告)号：US20160018443A1

公开(公告)日：2016-01-21

申请号：US14699306

申请日：2015-04-29

Applicant: Tektronix, Inc.

Inventor： Mark L. Guenther

IPC: G01R13/34

CPC classification number: G01R13/34 ,  G01R13/0272 ,  G01R31/31709

Abstract: A method for determining a correlated waveform, including acquiring a generalized waveform record with a repeating pattern, determining a possibly corrected recovered clock signal for the generalized waveform record, selecting a new sample rate that is higher than the clock rate by N time, where N is an integer greater than 1, resampling the generalized waveform so that the new samples fall precisely on two clocks instants of the recovered clock signal that define each unit interval, and on N−1 additional instants equally spaced between the two clock instants of each unit interval to create a resampled waveform, and forming the correlated waveform by taking the mean values of all samples from the resampled waveform having the same offset into a pattern repeat in unit intervals or fractions thereof.

Abstract translation: 一种用于确定相关波形的方法，包括获取具有重复图案的广义波形记录，确定用于广义波形记录的可能校正的恢复时钟信号，选择比时钟速率高N倍的新采样率，其中N 是大于1的整数，对广义波形进行重新采样，使得新采样精确地落在限定每个单位间隔的恢复时钟信号的两个时钟上，以及在每个单元的两个时钟之间等间隔的N-1个附加时刻 间隔以产生重采样波形，并且通过将来自具有相同偏移的重采样波形的所有样本的平均值取为单位间隔或其分数的模式重复来形成相关波形。

公开(公告)号：US20230324439A1

公开(公告)日：2023-10-12

申请号：US18121558

申请日：2023-03-14

Applicant: Tektronix, Inc.

Inventor： Mark L. Guenther ,  Pavel R. Zivny

IPC: G01R13/02

CPC classification number: G01R13/029

Abstract: A method of dynamically determining an oscilloscope noise characteristic includes retrieving a power spectral density (PSD) model of noise from a storage based upon a current configuration of the oscilloscope, generating a representation of any filtering being applied to a waveform generated by a device under test, using the PSD and the representation to produce a modified power spectral density, and using the modified power spectral density to determine a dynamic oscilloscope noise characteristic. A test and measurement instrument has one or more inputs to acquire waveforms from a device under test (DUT), one or more processors to retrieve a power spectral density (PSD) model of noise from a database, generate a representation of any filtering being applied to a waveform generated by the DUT, use the PSD and the representation to produce a modified PSD, and use the modified PSD to determine a dynamic instrument noise characteristic.

公开(公告)号：US20190227109A1

公开(公告)日：2019-07-25

申请号：US16255717

申请日：2019-01-23

Applicant: Tektronix, Inc.

Inventor： Mark L. Guenther

IPC: G01R29/26

Abstract: A test and measurement device for determining types of jitter, the test and measurement instrument including an input for receiving an input signal, a converter coupled to the input and structured to generate a spectral power signal for non-deterministic jitter from the received input signal, a threshold detector structured to identify ranges of the spectral power signal that are in excess of a threshold, a filter structured to filter the identified ranges of the spectral power signal, a Gaussian detector structured to determine whether the filtered ranges of the spectral power signal contain primarily Gaussian or non-Gaussian jitter, and a Q-scale analyzer structured to perform further signal analysis only if the Gaussian detector determined that the jitter in the filtered ranges of the spectral power signal contains a mixture of Gaussian and non-Gaussian jitter.